Yokogawa Electric Corporation

Hideko Tanaka

Toshiki Ohara

Youko Nozawa

Ryota Sakai

Yoshihisa Hidaka

Shigeru Takezawa

Akihiro Murata

Gen Matsuno

Kaori Sakuma

A measurement device includes: a container into which sample gas is to be injected; a liquefaction mechanism configured to liquefy the sample gas in the container; a near-infrared probe extending from inside to outside the container; and a near-infrared measuring instrument configured to measure an absorbance spectrum of the sample gas in a state of being liquefied by the liquefaction mechanism, via the near-infrared probe.

Analysis device, liquefied gas production plant, and property analysis method

Measurement device, calibration curve generation system, spectrum measurement method, calibration curve generation method, analysis device, liquefied gas production plant, and property analysis method

A method for testing an analysis apparatus that analyzes a first fluid flowing through a pipe using light that has passed through a probe attached to and disposed inside the pipe such that a portion of a light path passes outside a housing of the probe. The method includes: after a second fluid that absorbs less of the light than the first fluid has been introduced into the pipe, introducing a third fluid having predetermined absorption characteristics into the housing of the probe; and analyzing the absorption characteristics of the third fluid using the light that has passed through the probe.

Testing method and testing system

Growing community of inventors

Musashino, Japan

Hideko Tanaka