Minolta Company, Ltd.

Hideki Tanabe

Toshio Norita

Makoto Miyazaki

Hiroshi Uchino

Koichi Kamon

Eiro Fujii

Fumiya Yagi

Eiichi Ide

Akira Yahashi

Satoru Hirose

Tadashi Fukumoto

Takuto Joko

Yoshiko Sakagawa

Takashi Kondo

Eiiehi Ide

This invention is related to a three-dimensional measuring device for measuring three-dimensional positions of an objects. The three-dimensional measuring device comprises an optical projection system and an optical reception system. In a preliminary measurement prior to an actual measurement, the optical projection system projects slit light beam on the object with varying projection angle with in a narrow range, and the optical reception system receives the slit light beam reflected by the object and generates image signals corresponding to an amount of the received light synchronously with variation of the projection angle. Measurement conditions including intensity of the light beam and the projection angle for the actual measurement are set in accordance with the image signals of the actual measurement. Under the measurement conditions, the actual measurement is executed by projection the light beam on the object with varying the projection angle within a wide range.

Three-dimensional measuring device and three-dimensional measuring method

A three-dimensional input device including a light projecting device for projecting detection light, and an image sensing device for receiving the detection light reflected by an object and converting the received light to electrical signals. The detection light is controlled so as to scan the object periodically while changing the projection direction of the detection light, and to consecutively perform a plurality of scans at mutually different detection light projection angles in accordance with the predefined specifications at the start of operation.

Three-dimensional input device

An apparatus and method for detecting a three-dimensional image. The apparatus includes a projector which projects a reference light on an object; an image sensor which senses an image of the object; and a controller for controlling the projector and the image sensor, wherein the image sensor includes an aperture that restricts the passage of entering light; and an aperture controller for setting an aperture value for the aperture when receiving a two-dimensional image input, and setting an aperture value for the aperture when receiving a three-dimensional image input. The aperture value is set based on the intensity of received reference light. A processing unit determines the position of the object based on a relationship between an illumination direction of the reference light at the determined time center Npeak and an entrance direction of the reference light relative to the target pixel. A flicker detector detects a change frequency in light received by the image sensor, and the controller controls the image sensor to sense frames of an image at a frequency which is a multiple of the detected change frequency.

A three-dimensional measurement apparatus includes an optical system for scanning a reference beam across a target object to be measured, a light sensor which receives light reflected from the target object, and a processor for calculating a three-dimensional shape of the target object from the received light. An image for calculating the three-dimensional shape of the target object and an image for displaying the target object are both captured by the same sensor. The displayed image is a grayscale image that is based on a centroid that is calculated from multiple data samples taken for each pixel in the image as the target is being scanned.

Three dimensional measurement apparatus

A three-dimensional measurement device employs a slit ray projection technique to optically determine a three-dimensional image. The device offers a choice in operating modes between high-speed measurement, high-resolution measurement and large dynamic range in the depth direction, to accommodate various situations. The different modes of operation are achieved by selectively modifying one or more of the scanning speed of a projected reference beam, the readout speed of a photosensor, the line width or line spacing of the photosensor, and the number of lines per image frame.

Three-dimensional measurement apparatus

A three-dimensional measuring system comprises an optical system for emitting a light and optically scanning an object, a measuring sensor having an image pickup surface consisting of a plurality of picture elements and adapted to receive the light reflected on the surface of the object, a galvanometer mirror for changing a direction in which the light irradiates the object, a system controller for driving the measuring sensor so as to allow the same to output information on the quantity of light incident on each of the picture elements, and a barycentric calculation circuit for finding an instant when the light traverses each of the picture elements. This instant is found by implementing a barycentric calculation on the basis of outputs of the measuring sensor taken for a prescribed period of time and an instant at which each of the outputs is taken. The measuring system further comprises a host computer for finding a position on the surface of the object corresponding to each of the picture elements. This position is found on the basis of a relationship between a direction in which the light irradiates the object at an instant when the light traverses each of the picture elements and a direction in which the light reflected on the surface of the object is incident on each of the picture elements.

Three-dimensional measuring system and method of measuring the shape of

This invention is related to a three-dimensional measuring device for measuring three-dimensional positions of an objects. The three-dimensional measuring device comprises an optical projection system and an optical reception system. In a preliminary measurement prior to an actual measurement, the optical projection system projects slit light beam on the object with varying projection angle with in a narrow range, and the optical reception system receives the slit light beam reflected by the object and generates image signals corresponding to an amount of the received light synchronously with variation of the projection angle. Measurement conditions including intensity of the light beam and the projection angle for the actual measurement are set in accordance with the image signals of the actual measurement. Under the measurement conditions, the actual measurement is executed by projecting the light beam on the object with varying the projection angle within a wide range.

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Ibaraki, Japan

Hideki Tanabe