Mitutoyo Corporation

Hideki Shindo

Tatsuki Nakayama

Yoshiyuki Omori

Junsuke Yasuno

Naoki Izumi

Kotaro Hirano

Keiji Yamada

Atsushi Tsuruta

Yukihiro Sakata

Kazushi Noguchi

Ryosuke Watanabe

Youhei Onodera

Norimichi Ota

Yoshiyuki Oomori

Syuuzou Ueno

A positioning unit includes two or more the laser light sources disposed around a point sensor. Laser light beams from the two or more the laser light sources intersect at an adjustment point separated from a detection point, which is away from the point sensor, by a predetermined distance. The adjustment point is positioned on a desired measurement start point on a work, the point sensor is moved close to the work by the predetermined distance, and a measurement scan of the work is started.

Shape measuring apparatus and point sensor positioning unit

A traction nut has twist rollers pivotally supported so as to be rotatable in a state of defining an inclination angle with respect to an axis of a drive shaft, the inclination angle being equivalent to a lead angle; an open/close lever provided to switch between a friction-contact state and a disengaged state of the traction nut relative to the drive shaft; and a spring generating a biasing force such that the traction nut is brought into friction-contact with the drive shaft. In response to user operation, the open/close lever puts the traction nut in the disengaged state against the biasing force of the spring. When the user releases the open/close lever, the traction nut returns to the friction-contact state due to the biasing force of the spring.

Moving mechanism and form measuring apparatus

A profile measuring instrument usable to perform a rotary scanning measurement and a linear scanning measurement on a workpiece in the form of a revolution solid, includes: a turntable on which the workpiece is mounted, the turntable being rotatable around a predetermined rotation axis; a rotary scanning measurement unit being adapted to measure a displacement of a surface of the workpiece mounted on the turntable; a linear scanning measurement unit being adapted to measure a profile of the surface of the workpiece mounted on the turntable along a predetermined measurement axis; and an aligning mechanism being adapted to relatively move the linear scanning measurement unit and the turntable in a direction intersecting with the measurement axis. The linear scanning measurement unit and the turntable are adjusted to relative positions at which the measurement axis passes through the rotation axis.

Profile measuring instrument, adjusting method for profile measuring instrument, and profile measuring method

A surface texture measuring device includes a rotation driving device configured to rotate a measured substance, a roughness detector including a stylus provided displaceably at a tip of a detector main body and at least one skid provided at the tip of the detector main body and in the proximity of the stylus and outputting displacement of the stylus based on the skid as an electric signal, and a detector driving device configured to drive a detector holder. The detector holder includes a guide member driven by the detector driving device, a slide member configured to hold the roughness detector and provided slidably in a displacement direction of the stylus to the guide member, and an urging member configured to urge the slide member so that the skid always comes in contact with the measurement face of the measured substance.

Surface texture measuring device

A roundness measuring apparatus includes a stylus stocker and a controller. The stylus stocker stores plural types of styli prepared corresponding to shapes of measurement sites of a measurement target object. The stylus stocker can store styli in such a manner that each stylus can be held thereon and taken out thereof. The stylus stocker is provided outside a measurement region, which is determined on the basis of the operation range of a turntable and a detector driving mechanism. The detector driving mechanism can move the detector to the outside of the measurement region. When a measurement command is given, the controller carries out roundness measurement of the object while controlling the turntable and the detector driving mechanism. When a stylus replacement command is given, the controller carries out stylus replacement operation between a detector main unit and the stylus stocker while controlling the detector driving mechanism.

Roundness measuring apparatus

A circularity measuring apparatus includes: a rotary table on which a measured object is loaded; a contact-type stylus configured to contact a substantially circular measured surface of the measured object with an inclination; a holder configured to hold the stylus within a predetermined stroke range so that an inclination angle of the stylus is changeable; a displacement detector configured to detect a displacement of the inclination angle of the stylus, which is caused due to a contact between the stylus and the measured surface; and a controller configured to: estimate a position of a top end of the stylus based on an output of the displacement detector; and instruct the holder in an optimal stroke range in the position.

Circularity measuring apparatus

A roundness measuring apparatus includes: a stylus having a contact part; a holding member that holds the stylus while allowing displacement of the contact part; an elastic member that presses the contact part against a measurement target object; a detector holder that supports the holding member rotatably; a motor; an elastic force adjustment member that is rotatable and concentric with the holding member; a joining section that joins the elastic force adjustment member with the holding member to maintain relative rotational positions; and a restricting section that restricts rotation of the elastic force adjustment member at a predetermined rotational position. The displacement direction of the contact part is adjusted in a first rotation range. The rotational position of the holding member relative to the rotational position of the elastic force adjustment member changes with the rotation of the elastic force adjustment member being restricted in a second rotation range.

Surface texture measurement apparatus and roundness measuring apparatus

A reference fixture () for a roundness measuring instrument performs acquisition of origin information of a roundness measuring instrument () including a workpiece rotary mechanism () on which a workpiece is set and a probe () provided with a stylus () and also performs calibration of the probe (). The reference fixture () includes a mount (), a calibration master () provided on a top face of the mount () for calibrating the sensitivity of the probe (), an origin ball () disposed above the calibration master () for providing the origin information of the roundness measuring instrument () by the stylus () of the probe (), and a holder () that holds the origin ball ().

Reference fixture for roundness measuring instrument

An eccentricity adjusting motor ( ) is provided in eccentricity adjusting device ( ) that adjusts an eccentricity in a work. A tilt adjusting motor ( ) is also provided in tilt adjusting device ( ) that adjusts a tilt of the work. A processor ( ) computes the eccentricity and tilt of the work, based on which eccentricity/tilt compensating means ( ) control the motors ( ) to compensate the eccentricity and tilt of the work.

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Kure, Japan

Hideki Shindo