Rohm Co., Ltd.

Hideki Matsubara

Tomoki Yamamoto

Satoru Kominami

Hiroyoshi Ishida

Hiroki Yamakami

A switch monitoring device includes a constant current source which supplies a current to an input line or extracts a current from the input line, a switch which connects the input line to a supply voltage or to a ground voltage, a comparator which compares a voltage on the input line with a reference voltage, a logic which receives an output voltage of the comparator, a base current source which generates a base current, and a bias current circuit which generates a bias current by adjusting the base current as a base in accordance with a current control signal from the logic and the output voltage of the comparator. The constant current source generates a current by adjusting the bias current as a base.

Switch monitoring device, switch state detection circuit, and a vehicle-mounted switch system

A switch state detection circuit according to the present invention comprises: a plurality of switch connection portions to each of which a switch is connected, a connection line to which any one of the switch connection portions is connected in a switchable manner, a detection portion that detects a state of the switch connected to the connection line based on a state of the connection line, and a connection control portion that switches successively each of the switch connection portions and connects it to the connection line, wherein the state of each switch is detected.

Switch state detection circuit and switch system

A circuit control device for controlling power consumption of a plurality of circuit units includes a monitoring unit configured to monitor whether a detection temperature of each of the circuit units meets a predetermined overheat condition, and an overheat protection unit configured to execute an overheat protection operation when the overheat condition is met in any one of the circuit units, wherein the overheat protection operation is an operation to reduce power consumption of an overheat unit meeting the overheat condition, among the circuit units, and a neighbor unit disposed near the overheat unit.

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Kyoto, Japan

Hideki Matsubara