Fujitsu Corporation

Hideki Isobe

Kenji Abe

Akira Miho

Tatsuya Akiyama

A simulation coverage calculating apparatus is provided for calculating a simulation coverage for a complete verification. The apparatus includes a first input unit, a second input unit, an effective test pattern calculating unit, a coverage ratio calculating unit, and an output unit. The first input unit reads a property that represents effective test patterns to a logic circuit to be verified. The effective test pattern calculating unit calculates the effective test patterns based on the property. The second input unit reads the test patterns entered and executed by a verifier. The coverage ratio calculating unit calculates a coverage ratio from a ratio of the number of the test patterns matched to the effective test patterns to the number of all of the effective test patterns. The output unit outputs the calculated coverage ratio.

Apparatus and method for calculating simulation coverage

An analog-to-digital converter includes a sample and hold circuit for sampling and holding an analog input signal, a comparator circuit for comparing the analog input signal held by the sample and hold circuit with an input signal and generating an output signal, a control circuit for generating a digital signal based on the output signal of the comparator circuit, a digital-to-analog converter for converting the digital signal generated from the control circuit into an analog signal and for supplying the analog signal to the comparator circuit as the input signal, and an initial setting circuit for initializing the analog input signal held by the sample and hold circuit and the input signal which is output from the digital-to-analog converter to a reference voltage.

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Kawasaki, Japan

Hideki Isobe