Micron Technology Incorporated

Oki Electric Industry Co., Ltd.

Ps4 Luxco S.a.r.l.

Other

Oki Semiconductor Co., Ltd.

Hidekazu Noguchi

Toshiyuki Sato

Yangsung Joo

Masaru Morohashi

Yoshio Mizukane

Koji Kuroki

Hidenori Uehara

Shingo Mitsubori

Yukimi Morimoto

Manami Senoo

Apparatuses and methods for controlling access to memory cell matrices are described. An example apparatus includes: a plurality of memory cell matrices including memory cells, a plurality of sections wherein each section is included in a memory cell matrix of the plurality of memory cell matrices; a section predecoder that activates one section signal among a plurality of corresponding section signals responsive to a portion of row address signals; a section selection control circuit that provides a set of first section sub signals including an active first section sub signal and a set of second section sub signals including an active second section sub signal based on the plurality of section signals; and a plurality of section selection circuits corresponding to the plurality of sections. One section selection circuit among the plurality of section selection circuits activates the corresponding section responsive to the active first and second section sub signals.

Apparatuses and methods of memory access control with section predecoding and section selection

Apparatuses and methods for calculating targeted refresh addresses may include circuitry that may be used to calculate victim row addresses having a variety of spatial relationships to an aggressor row. The spatial relationship of the victim row addresses calculated by the circuitry may be based, at least in part, on states of control signals provided to the circuitry. That is, the circuitry may be used to calculate the different victim row addresses by changing the states of the control signals.

Apparatuses and methods for generating refresh addresses

Apparatuses, systems, and methods for partial array self refresh masking. A memory bank may be divided into a number of segments, each of which is associated with partial-array self-refresh (PASR) logic which provides a mask signal. The mask signal may be deactivated responsive to an access operation performed on the associated segment. While the mask signal is deactivated, self-refresh operations are performed on the segment. A period of time after deactivating the mask signal, the mask signal may be reactivated.

Apparatuses and methods for partial array self refresh masking

Apparatuses including threshold voltage compensated sense amplifiers and methods for compensating same are disclosed. An example threshold voltage compensated sense amplifier according to the disclosure includes circuits, such as a first transistor having a first conductivity type coupled to a first node and a second node; a second transistor having a second conductivity type coupled to the first node and at third node; a plurality of transistors coupled to the second node and further configured to receive a power supply voltage; and a control circuit configured to provide a plurality of control signals to the plurality of transistors. The control circuit provides the plurality of control signals indicative of a first drive strength in a first memory operation and further provides the plurality of signals indicative of a second drive strength in a second memory operation.

Apparatuses and methods of power supply control for threshold voltage compensated sense amplifiers

Embodiments of the disclosure are drawn to apparatuses and methods for controlling refresh operations. Responsive to a refresh command, or one or more pumps generated responsive to the refresh command, different banks of a memory array may perform different types of refresh operations for a pump. In some examples, the type of refresh operation performed by a bank may vary from pump to pump of a refresh operation.

Apparatuses and methods for controlling refresh operations

Disclosed herein is an apparatus that includes a first circuit configured to generate a first signal a first number of times in response to an input signal, a second circuit configured to generate a second signal having a second numerical value each time the first signal is activated, and a third circuit configured to receive the second signal to update a count value obtained by accumulating the second numerical value, configured to generate a third signal each time the count value reaches a third numerical value, and configured to update the count value obtained by accumulating the second numerical value and subtracting the third numerical value when the count value reached the third numerical value.

Average interval generator

An example apparatus according to an aspect of the present disclosure includes an address scrambler circuit including a sub-wordline scrambler circuit configured to receive a first subset of bits of a row hammer hit address. The sub-wordline scrambler circuit is configured to perform a first set of logical operations on the first subset of bits to provide a second subset of bits, and to perform a second set of logical operations on the first subset of bits and the second subset of bits to provide a third subset of bits of an row hammer refresh address.

Apparatuses and methods for calculating row hammer refresh addresses in a semiconductor device

Apparatuses and methods for a temperature dependent delay between a wordline off signal and deactivating the wordline are disclosed. Memory devices may have reduced reliability when operating at relatively cold temperatures, which may be due in part to an increase in the write recovery time while the inning for a wordline to deactivate remains relatively unaffected. In some embodiments of the present disclosure, a delay circuit is used to insert a temperature dependent delay between a wordline off command being issued and the wordline being deactivated. The delay circuit may increase the length of temperature dependent delay at relatively cold temperatures, and decrease the length of the delay at relatively warm temperatures.

Apparatuses and methods for DRAM wordline control with reverse temperature coefficient delay

Refresh commands may be provided at random intervals from a memory controller to a memory device. In some examples, refresh requests may be provided at random intervals which may be used to provide refresh commands from the memory controller to the memory device at random intervals. In some examples, an average time interval between refresh requests may be equal to a refresh interval of the memory device. In some examples, a maximum number of times the memory controller may postpone providing a refresh command to the memory device may be a random number. In some examples, a maximum value of the random number may be based, at least in part, on a minimum number of refresh commands required within a time interval by the memory device.

Apparatuses and methods for controlling refresh timing

Embodiments of the disclosure are drawn to apparatuses and methods for distributed timing of targeted refresh operations. Information stored in volatile memory cells may decay unless refresh operations are performed. A memory device may perform auto-refresh operations, as well as one or more types of targeted refresh operations, where particular rows are targeted for a refresh. Targeted refresh operations may draw less power than an auto-refresh operation. It may be desirable to distribute targeted refresh operations throughout a sequence of refresh operations, to average out a power draw in the memory device. Responsive to an activation of a refresh signal, the memory device may perform a group of refresh operations. At least one refresh operation in each group may be a targeted refresh operation.

Apparatuses and methods for distributed targeted refresh operations

Apparatuses and methods for a temperature dependent delay between a wordline off signal and deactivating the wordline are disclosed. Memory devices may have reduced reliability when operating at relatively cold temperatures, which may be due in part to an increase in the write recovery time while the timing for a wordline to deactivate remains relatively unaffected. In some embodiments of the present disclosure, a delay circuit is used to insert a temperature dependent delay between a wordline off command being issued and the wordline being deactivated. The delay circuit may increase the length of temperature dependent delay at relatively cold temperatures, and decrease the length of the delay at relatively warm temperatures.

A word driver drives a word line with a first power supply voltage and with a second power supply voltage which has a potential lower than the first power potential, respectively in a first time period and in a second time period following the first time period for activating the word line.

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Tokyo, Japan

Hidekazu Noguchi