Sharp Kabushiki Kaisha Corporation

Hideji Marumoto

Masaya Okamoto

Yuzuru Kanemori

Katsumi Irie

Mikio Katayama

Hiroaki Kato

Naofumi Kondo

Toshiaki Fujihara

Kiyoshi Nakazawa

Kozo Yano

Hidenori Negoto

Kazuyori Mitsumoto

Hiroshi Fujiki

Kumiko Otsu

Mitsuaki Hirata

Takehisa Sakurai

Katsuhiro Kawai

Nobuyuki Kawase

Koji Fukuda

Masasi Hosomi

Yuichiro Mochizuki

An active display device, comprising: a plurality of source buses and a plurality of gate buses; a plurality of pixel electrodes, said pixel electrodes each having associated therewith a switching element for delivering a drive signal to said pixel electrode from at least one of said source buses as a function of a signal provided by at least one of said gate buses; and means other than said switching elements for selectively electrically connecting at least one of said pixel electrodes to a corresponding one of said source buses in the event said at least one pixel electrode is considered to be defective.

Active matrix display device

The inspection apparatus of the invention inspects a display device including first and second bus lines formed on an active matrix substrate. The inspection apparatus includes a first substrate unit and a second substrate unit each having a pair of substrates and connecting films therebetween. On one substrate of each substrate unit, inspection terminals and first inspection lines are formed and each of the inspection lines are connected to one of the inspection terminals. On the other substrate of each substrate unit, second inspection lines are provided. The first and second inspection lines of the substrates are selectively connected by the connecting films. During inspection, the second inspection lines of the first substrate unit are brought directly in contact with the first bus lines, so that each of the first bus lines is connected to one of the inspection terminals of the first substrate unit. Each of the second bus lines is connected to one of the inspection terminals of the second substrate unit via the respective second inspection lines in the same way. The apparatus further includes: a driving signal input circuit for supplying driving signals for a display inspection of the display device to the inspection terminals of each substrate unit; a resistance measuring device for measuring resistances of the first and second bus lines of the display device; and a section for connecting either of the driving signal input circuit or the resistance measuring device to the first and second substrate unit.

Inspection apparatus and method for display device

An active matrix display device which includes a first and a second insulating substrates, a gate bus an adjacent gate bus, and a source bus arranged on the first substrate, a pixel electrode in a segment enclosed by the gate and the source buses, a switching element connected to the pixel electrode, the gate bus and the source bus, wherein the source bus comprises a projection extending toward the pixel electrode so as to be electrically disconnected therefrom, and the adjacent gate bus comprises a projection extending toward the pixel electrode, the source bus being overlaid on the adjacent gate bus projection with an insulating layer sandwiched therebetween, the adjacent gate bus projection being provided with an electroconductive member at the top thereof with an insulating layer sandwiched therebetween, the electroconductive member being electrically connected to the pixel electrode, and electrically disconnected from the source bus projection.

Fault tolerant active matrix display device

An active matrix display device which includes a pair of insulating substrates, a first group of buses formed on one of the sides of the insulating substrates, a second group of buses crossing the first group of buses, conductive film wirings formed on the second group of buses, wherein the width of each conductive film wiring at stepped portions of the first group of buses is not smaller than that of the conductive film wirings located out of the stepped portions.

Growing community of inventors

Kashiba, Japan

Hideji Marumoto