Other

Hideho Hisada

Osamu Saito

Shinichiro Watanabe

Shinya Saito

Motoichi Ohtsu

Yoshihito Narita

Tatsuya Miyajima

Susumu Teruyama

Koji Akutsu

In a probe microscope for causing a sample and a tip portion of a probe on the sample side to approach each other, detecting an interaction between the sample and the sample-side probe tip portion , and obtaining surface information of the sample from the interaction, the probe being a flexible needle-like probe; the probe microscope comprises vibrating means capable of rotating the probe while flexing the sample-side tip portion thereof so as to draw a circle having a size corresponding to an increase and decrease in the interaction between the sample surface and the tip portion , and detecting means for detecting the increase and decrease in the size of the circle drawn by the sample-side probe tip portion due to the interaction and obtaining, from the increase and decrease in the size of the circle, information about the distance between the sample and the sample-side probe tip portion

Rotating probe microscope

Growing community of inventors

Tokyo, Japan

Hideho Hisada