Hitachi, Ltd.

Renesas Technology Corp.

National Research Institute of Police Science

Hitachi Engineering Services Co., Ltd.

Hidehiro Okada

Yasuaki Takada

Izumi Waki

Hisashi Nagano

Yasuo Seto

Isaac Ohsawa

Masao Suga

Tetsuya Maruyama

Tatsuo Nojiri

Yasuhiro Sano

Shigeharu Yamashiro

Hiroshi Sekiguchi

Hiroya Koshishiba

Akihiko Okumura

Yukiya Hattori

Hisashi Maruko

Kyoichiro Wakayama

A gas monitoring apparatus includes a sample introducing portion, a measurement portion, an ionization portion, a mass analysis portion, a data processing portion and a display. The sample introducing portion introduces a sample gas including an object material to be measured. The measurement portion measures a concentration of a predetermined coexisting material, which coexists with the object material in the sample gas. The ionization portion ionizes the sample gas. The mass analysis portion analyzes mass of an ion produced by the ionization portion. The data processing portion analyzes signals detected by the mass analysis portion to calculate a concentration of the object material. And the display displays results of analysis conducted by the data processing portion. The data processing portion includes an adjustment portion which adjusts the concentration of the object material according to the concentration of the predetermined coexisting material.

Gas monitoring apparatus

A gas monitoring apparatus capable of real-time detection of a kind of chemical warfare agent, namely diphenylcyanoarsine (DC) and/or diphenylchloroarsine (DA). Atmospheric pressure chemical ionization mass spectrometry is carried out in the positive ionization mode, the total amount of DC and DA is determined from the intensity of an ion common to DC and DA, the DC concentration is determined from the intensity of an ion specific to DC, and the difference between them is regarded as the DA concentration.

Gas monitoring apparatus and gas monitoring method

An image pickup unit is disposed so as to be able to obtain a scan projection image of an inspection subject from each of a vertical direction and a horizontal direction. An X-ray absorption coefficient of an object in the inspection subject is obtained from the vertical scan projection image and the horizontal scan projection image. It is determined whether there is a threat in the inspection subject on the basis of the X-ray absorption coefficient. Furthermore, a CT image is obtained by moving the image pickup unit around the inspection subject. It is determined whether there is a threat in the inspection subject, on the basis of the CT values of the CT image.

Apparatus and method for detecting threats

A semiconductor integrated circuit is segmented into a plurality of blocks. Each block includes a switching transistor which is connected between the CMOS circuit of the block and the ground point and is adapted to shut off the current of the CMOS circuit by being controlled by a test mode control signal, and a leakage current detecting circuit which has a self-check function for the block. A signal which is the logical sum of the outputs of the leakage current detecting circuits of all blocks is the led out of the semiconductor integrated circuit through a common external output terminal.

Semiconductor integrated circuit

A semiconductor integrated circuit is segmented into a plurality of blocks. Each block includes a switching transistor which is connected between the CMOS circuit of the block and the ground point and is adapted to shut off the current of the CMOS circuit by being controlled by a test mode control signal, and a leakage current detecting circuit which has a self-check function for the block. A signal which is the logical sum of the outputs of the leakage current detecting circuits of all blocks is led out of the semiconductor integrated circuit through a common external output terminal.

Growing community of inventors

Tokyo, Japan

Hidehiro Okada