Matsushita Electric Industrial Co., Ltd.

Matsushita Graphic Communication Systems, Inc.

Hidehiko Kawakami

Hideaki Kawamura

Hiroyoshi Tsuchiya

Yuji Maruyama

Atsuharu Yamamoto

Katsuo Nakazato

Kunio Sannomiya

Hiroaki Kotera

Hideo Uchida

Hirotaka Otsuka

Katsuhiro Kanamori

Toshiharu Kurosawa

Hidemi Takahashi

Yoshimitsu Kanno

Iwao Ichikawa

Katsuhiro Kondoh

Yoshio Watanabe

Motohiko Naka

Toyoki Kawahara

Masaki Tokoi

Kazuo Tomida

Yoshihiro Uno

Hiroaki Fukushima

Mutuo Hashizume

Hideaki Ohira

Masaaki Nakashima

Hiroyoshi Otsuka

A method for displaying a moving picture having a proper tone by changing a combination of subfields constituting a field of the moving picture, the subfields each having a different weight of luminance, a motion vector indicating a moved direction of the image and a moved quantity thereof is detected from image data, new image data for providing a tone equivalent to a tone to be received by a retina to the retina when the image moves is generated corresponding to the detected motion vector, and the combination of subfields is determined based on the generated new image data.

Moving picture display method and apparatus

A wiring pattern inspection apparatus for inspecting an abnormality of a wiring pattern formed on a printed circuit board, which is equipped with an optical image pickup device for optically illuminating a surface of the printed circuit board including the wiring pattern to photoelectrically convert optical information of the printed circuit board surface due to the optical illumination into a grey level image. This grey level image is converted into a bi-level image which separates the grey level image into the wiring pattern side and a background side of the wiring pattern. Thereafter, the bi-level image is once contracted by a first size and then expanded by a second size so as to eliminate a micro conductive portion left on the printed circuit board or a micro pinhole which can be disregarded in the abnormality inspection, thereby preventing the excessive detection.

Wiring pattern inspection apparatus for printed circuit board

Pieces of feature information in a bi-level image such as a width, a branching point and an ending point of a wiring pattern are detected in a design rule checking section according to a micro inspection to find out pieces of feature information departing from a design rule. Also, feature codes in the bi-level image such as a corner of the wiring pattern are detected in a specific shape detecting section according to a macro inspection. The feature information are compared with pieces of referential feature information pertaining to a non-defective wiring pattern in a first comparing and judging section to judge whether the wiring pattern indicated by the feature information is defective or non-defective. The feature codes are compared with referential feature codes pertaining to a non-defective wiring pattern in a second comparing and judging section to judge whether the wiring pattern indicated by the feature codes is defective or non-defective. Therefore, defective types and portions of the wiring pattern can be detected by performing the macro inspection and the micro inspection in parallel without dividing the wiring pattern into processed regions.

Apparatus for inspecting a wiring pattern according to a

An inspection apparatus for inspecting a wiring pattern on a printed board by illuminating the printed board with light to photoelectrically convert light reflected from the printed board into an optical grey level image corresponding to the wiring pattern thereon, the grey level image being converted into a bi-level image. The inspection apparatus includes a thinning circuit to perform a thinning process for removing the bi-level image by one picture element from the background side of the wiring pattern, the thinning process being repeatedly performed predetermined times with respect to all of picture elements of the wiring pattern to output the number of repetitions of the thinning process and further to output a skeleton image. Also included is a distance image converter to output a distance conversion image where the number of repetitions is given as a distance value from the background of the wiring pattern. The inspection apparatus compares the distance value of the distance conversion image with one or more thresholds along the skeleton image. This arrangement allows direct detection of the wiring pattern width, thereby permitting the wiring pattern inspection with a simple structure.

Apparatus for inspecting wiring pattern formed on a board

A color value correction apparatus for converting each of successive combinations of input tricolor digital values into an output color value in accordance with predetermined data stored in memory, includes three table memories which store values which are respective differences between color values corresponding to vertices of unit tetrahedra in a color space and a reference color value that is common to all of a set of tetrahedra forming one of an array of unit cubes or parallelepipeds which constitute that color space, and also includes a table memory that stores these reference color values. To obtain an interpolated output value, each of these memories is addressed three-dimensionally by the high-order bits of an input tricolor value combination to thereby specify one of the unit cubes or parallelepipeds, and the difference value memories are in addition addressed by a value, derived from the low-order bits of the input value combination, specifying a specific tetrahedron containing the interpolation point. An interpolated output value can thereby be obtained by executing only three multiplication operations followed by addition operations.

Apparatus for correction of color signal values

A correspondence relation between a structure of a bi-level pattern A and a structure of a bi-level pattern B is statistically learned by use of a learning high-density image. The bi-level pattern A forms a partial region of a low-density character and line image except a screened dot image. The bi-level pattern B forms a corresponding partial region of a desired high-density image. A judgement is made as to whether the low-density image is equal to or different from a screened dot image. Reference pixels are selected from the partial region of the low-density image. The low-density bi-level pattern A is converted into the high-density bi-level pattern B on the basis of a result of the learning by use of the selected reference pixels when the low-density image is different from a screened dot image. A pixel of the low-density image is repeated to convert the low-density image into the high-density image when the low-density image is equal to a screend dot image.

Method and apparatus for converting a line density of a bi-level image

A pattern inspection system for inspecting a pattern of a land for a through-hole formed in a printed board. In the system there are included a first illumination device for optically illuminating the printed board, a second illumination device for illuminating the printed board with light modulated at a predetermined period and an image pickup responsive to reflection light and transmission light from the printed board due to the first and second illumination devices to photoelectrically convert the printed board into a gray level image. The gray level image is converted into a bi-level image by a bi-level conversion device and then converted into an edge image by an edge detecting device. The edge image is expanded and contracted by predetermined amounts so as to obtain a through-hole image corresponding to the through-hole. A defect detecting device detects a defect of the pattern of the printed board on the basis of the through-hole image and the bi-level image from the bi-level conversion device.

Pattern inspection system for inspecting defect of land pattern for

A color correction method applicable to a digital processing type of color copier, whereby a set of color patches of respectively different sample colors is printed using a set of printing data values, the color patches are then scanned and analyzed to obtain color patch input data values by the color copier, and each of all of the possible input color data values that can be produced by the scanner/analyzer section of the color copier is then related to one of the color patch input data values which is closest thereto in a 3-dimensional color space. Each of these possible input color data values is thereby related to an appropriate color printing value, whereby a color correction table can be generated which provides correction accuracy that is independent of non-linearity of color printing characteristics.

Color correction method for color copier utilizing correction table

An image processor for reproducing a continuous tone image such as a photograph in a black-and-white binary dot image (halftone image) has a linear correction section for converting a sampled digital image signal in a predetermined manner controlled by black and white densities of an original, thereby performing linear conversion between the continuous tone image and the halftone image. The image processor also has another correction section for performing profile emphasis to obtain a clear halftone image.

Image processor

The invention relates to a method for processing an image signal such that areas of original image data are sequentially scanned with a scanning window having a size corresponding to M picture elements in units of a predetermined number of picture elements so as to perform halftone display in accordance with black-and-white binary distribution with respect to the signal levels of the picture elements within the scanning window every time the scanning window is moved. The picture elements within the scanning window are assigned an order of preference in accordance with their image signal levels. A sum of the image signal levels of the picture elements within the scanning window is calculated, and A and N of the equation S=C.times.N+A are calculated, where C is a predetermined image signal level (e.g., black level and maximum level), N is an integer, and A is the image signal level falling within the range 0.ltoreq.A&lt;C. As a result of the preference operation, N picture elements are assigned a level C, the next picture element is assigned a level A, and the remaining picture elements, 0. In order to impart regularity to the converted image signal distribution, additional data is added to the preference data.

Method and apparatus for processing image signal

A method for processing a video signal comprises defining a successively shifted scan window with respect to the signal level of each picture element from which said video signal has been derived, totalizing the quantum numbers of the picture elements in the scan window corresponding to the original screen dot, and reconstructing black picture elements corresponding to the total value of the quantum numbers faithfully to the area of the original dot, and an apparatus for carrying out the method.

Method and apparatus for processing video signals

In a variable density scanner a light beam of a fixed spot size is scanned on an original along each of a plurality of parallel line paths at a constant speed to generate a video signal and successively shifted to the next line path. The video signal is sampled to generate a video sample. Each of the line paths is divided into a plurality of line segments so that each segment derives a plurality of video samples and the line paths are formed into a plurality of groups of adjacent line paths so that the video samples are derived from a plurality of patterns of rows and columns. The total value of the video samples of each pattern is arithmetically divided by their number in response to the control signal to derive an average value.

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Tokyo, Japan

Hidehiko Kawakami