Shimadzu Corporation

Hideharu Shichi

Kei Kodera

Kosuke Hosoi

A spectrum acquirer acquires a plurality of mass spectrums. A specific physical quantity calculator calculates a specific physical quantity reflecting an amount of ions with respect to each of the plurality of obtained mass spectrums. A spectrum sorter sorts the plurality of mass spectrums in order of the specific physical quantity calculated with respect to each mass spectrum. A display controller allows a display to display the plurality of sorted mass spectrums. A spectrum selector selects a plurality of mass spectrums having specific physical quantities in a designated range from the plurality of displayed mass spectrums. A post-selection spectrum integrator integrates the plurality of selected mass spectrums. The display controller allows the display to display the post-selection integrated mass spectrum.

Spectrum calculation processing device, spectrum calculation processing method, ion trap mass spectrometry system, ion trap mass spectrometry method and non-transitory computer readable medium storing spectrum calculation processing program

The mass spectrometer includes an ionizer, a mass separator, a detection device, a storage, and a controller. The detection device includes a detector and an electron introducer. The electrons from the electron introducer are introduced into the detector. In addition to an analysis operation, the mass spectrometer performs an operation to determine a voltage applied to the detector. At this point, electrons are introduced from the electron introducer to the detector. In the case that a detection value from the detector is less than a threshold, the controller can determine that a defect such as aging is generated in the detector.

Mass spectrometry detection device and mass spectrometer

The invention provides a matrix observation device where a location to be irradiated with a laser beam that provides high efficiency of the ionization can be found from among sample spots arranged on a sample plate. The device is formed of: a stageon which a sample plateon which a sample is to be arranged is to be placed; a light source unitthat emits ultraviolet rays for observation with which the sample plateis irradiated; and an image acquisition unitfor detecting light from the sample plateso as to create an optical image, and the sample contains a matrix that absorbs the ultraviolet rays for observation.

MALDI mass spectrometer and matrix observation device

An ion analyzer includes: a sample placement uniton which a sampleis to be placed; an excitation beam irradiation unitthat irradiates the sampleplaced on the sample placement unitwith an excitation beam in a direction perpendicular to a surface of the sample; a deflection unitthat makes at least some of ions generated from the sampleto fly in a direction deviating from an irradiation path of the excitation beam; and an analysis unitdisposed in a flight direction of ions deflected by the deflection unit, that separates and measures the ions in accordance with a predetermined physical quantity.

Ion analyzer

A mass spectrometer includes an ion source that generates ions, an ion trap that captures the ions generated from the ion source, a detector that detects the ions ejected from the ion trap and a controller that controls a periodic voltage, which is added to form a capturing electric field in the ion trap and controls a time point at which the ions are generated from the ion source. The controller includes an ion generation time controller that allows the ions to be generated from the ion source at N (N is an integer equal to or larger than 2) phase time points while addition of the periodic voltage is continued, the N phase time points being set in one period of the periodic voltage and being respectively assigned to different periods of the periodic voltage.

Mass spectrometer, ion generation time control method and non-transitory computer readable medium

An ion source of an ion trap mass spectrometer generates ions of a component in a sample. An ion trap captures the ions generated by the ion source. An ion detector detects ions ejected from the ion trap. A voltage application control part changes a voltage applied to the ion detector such that, after generation of ions by the ion source is started, ion detection capability of the ion detector during a time period when ions having a mass-to-charge ratio outside an analysis target range are ejected from the ion trap is lower as compared to ion detection capability of the ion detector during a time period when ions having a mass-to-charge ratio within the analysis target range are ejected from the ion trap.

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Kyoto, Japan

Hideharu Shichi