Fei Comapny

Hervé-William Rémigy

Pleun Dona

Mikhail Mikhaylovich Ovsyanko

Uwe Luecken

Hendrik Nicolaas Slingerland

Gerbert Jeroen Van De Water

Laurens Franz Taemsz Kwakman

Kasim Sader

Martin Verheijen

Stephanus Hubertus Leonardus Van Den Boom

Karin Smulders-Weemers

Frank Nijpels

Karin Smulders

Mikhail Ovsyanko

A method of preparing a cryogenic sample (e.g. for study in a charged-particle microscope), whereby the sample is subjected to rapid cooling using a cryogen, comprising the following steps:

Preparation of cryogenic sample, e.g. for charged particle microscopy

A method of preparing a sample for study in a charged-particle microscope, whereby the sample is subjected to rapid cooling using a cryogen, comprising the following steps:

Preparation of cryogenic sample for charged-particle microscopy

A system and method for preparing a sample for study in a charged-particle microscope is disclosed. A sample holder comprises substantially parallel opposing faces connected by apertures spanned by a perforated membrane. Blotting material is placed against the outer membrane surface, and liquid films may then be deposited onto the inner membrane surface within each aperture where each aperture can contain a unique sample. Liquids from each sample flow through the perforations in the membrane to be absorbed by the blotting material. After completion of deposition of liquid samples, the sample holder is raised off the blotting material, leaving aqueous samples within the perforations of the membrane. The sample holder may then be immersed in a vitrifying bath of liquid oxygen to form a cryo-sample for microscopic imaging and analysis.

Preparation of sample for charged-particle microscopy

A method of preparing a sample for a charged-particle microscope includes: A corresponding apparatus is also described.

A method of determining the temperature of a sample carrier in a charged particle-optical apparatus, characterized in that the method comprises the observation of the sample carrier with a beam of charged particles, the observation giving information about the temperature of the sample carrier. The invention is based on the insight that a charged particle optical apparatus, such as a TEM, STEM, SEM or FIB, can be used to observe temperature related changes of a sample carrier. The changes may be mechanical changes (e.g. of a bimetal), crystallographic changes (e.g. of a perovskite), and luminescent changes (in intensity or decay time). In a preferred embodiment the sample carrier shows two bimetals, showing metals with different thermal expansion coefficients, bending in opposite directions. The distance between the two bimetals is used as a thermometer.

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Eindhoven, Netherlands

Hervé-William Rémigy