Kla-tencor Mie Gmbh

Hermann Bittner

Lambert Danner

Albert Kreh

Henning Backhauss

Wolfgang Vollrath

Gerhard Hoppen

Roland Hedrich

Kurt Hahn

Christof Krampe-Zadler

Alexander Büttner

An apparatus () for the optical inspection of wafers is disclosed, which comprises an assembly unit () which carries optical elements () of at least one illumination path () for a bright field illumination and optical elements () of at least one illumination path () for a dark field illumination. The assembly unit () furthermore carries plural optical elements () of at least one detection path (). An imaging optical element () of the at least one illumination path () for the bright field illumination (), imaging optical elements () of the at least one illumination path for the dark field illumination, and imaging optical elements () of the at least one detection path () are designed in such a way that all illumination paths () and all detection paths () are telecentric.

Apparatus for the optical inspection of wafers

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Limburg, Germany

Hermann Bittner