Ernst Leitz Wetzlar Gmbh

Wild Leitz Gmbh

Ernst Leitz Wetzlor Gmbh

Herbert Leiter

Gunter Reinheimer

Winfried Kraft

Guenter Reinheimer

Herbert Koch

Andreas Hund

A microscope is disclosed having an illumination device that includes a color temperature regulating device and a color temperature measurement device. The color temperature regulating device includes a light guide and two conversion filters that are disposed on a carrier and are adjustable in a motor-driven manner. Moreover, a color temperature control device is provided, which compares the color temperature determined in the measurement device with a predetermined theoretical value and supplies a corresponding signal to the color temperature regulating device. Furthermore, a measurement or regulating device for the intensity of illumination or light intensity is provided, which compensates the change of light intensity by a motor-controllable diaphragm in the illumination beam path.

Microscope with a camera and automatic color temperature balance

Process and device for photographing microscopic objects

Processes for the introduction, visualization and/or recording of a variable detail metering field stop into part ray paths of a camera for optical instruments, for example microscopes, are described. In addition, appropriate devices are specified. They contain a reversibly illuminable multifield matrix (4), which is provided, at a fixed location, in a plane which is conjugated with the eyepiece intermediate image plane of the optical instrument. The multifield matrix (4) is activated by a processor (22) in such a fashion that the transmission characteristics of the entire multifield matrix (4), or of at least one geometrical subregion of this matrix, are altered spontaneously reversibly, the following process steps being carried out: an object (3) is imaged on the multifield matrix (4); all fields of the multifield matrix (4) are cleared one after the other while simultaneously measuring the light passing through each cleared field; the measured values obtained are fed to a computer (23); the individual measured brightness signals are evaluated by the computer (23) and the measured values of those fields which feature object image structures are stored; all fields of the multifield matrix (4) which feature object image structures are cleared by the processor (22); the ideal exposure time is determined by the computer (23); the time values determined by the computer (23) are passed on to the camera shutter 7, which then carries out its function in a known fashion.

Process and device for the introduction, visualization and/or recording

An attachment camera for microscopes, comprising an apparatus for measuring the brightness of an object detail and markings for sighting at least the detail metering field and the image field of the camera in the observation beam. The metering field markings and the image field markings are located on two separate plates, the plate with the metering field marking is defined by a measuring field stop. The two markings differ in size and shape and are simultaneously reflected into the observation beam by means of a photographic ocular located in the picture taking beam and by means of optical components with partly or fully reflecting surfaces located before or after the photographic ocular. A holder (5a) seating in exchangeable manner the photographic ocular (5) is provided between the housing (24) of the attachment-camera and the binocular tube (25).

Microscope attachment camera

Photomicrographic exposure meter for cameras attached to microscopes in which part of the picture-taking beam is reflected by means of a beam-splitter and where the reflected beam part projects an image of the object onto an image plane, measuring field stop is located in the image plane with an aperture for detail or spot measurements and an insertable photo-electric detector cooperates therewith downstream of the stop in the direction of light. The beam part is reflected by at least one specular means (12,61) to the measuring field stop (13). The stop is gimbal-suspended and means are provided both for displacing the gimbal-suspended specular means (12,61) and for viewing the object detail appearing in the stop aperture.

Exposure meter for photomicrography

Disclosed is a light-metering system for an attachment camera of the type particularly adapted for use with an optical observation instrument having an optical axis comprising a mounting means positioned between the observation instrument and the shutter of the camera and being movable in at least two degrees of freedom; optical means positioned on the optical axis of the observation instrument for selectively deriving either an observation beam or a metering beam from the beam path of the observation instrument; a measuring diaphragm mounted on the mounting means and arranged in the image plane of the metering beam; a photoelectric receiver associated with the measuring diaphragm; a set of markings carried by the mounting means opposite to the measuring diaphragm and positioned in the observation beam; means positioned in the observation beam in a plane conjugated with the image plane of the observation instrument for viewing the image superimposed upon the set of markings; and means for moving the mounting means in the at least two degrees of freedom in order to selectively adjust the location on the viewing means of the set of markings which indicates the image area which is to be evaluated from the image field of the observation instrument.

Light-metering system in attachment camera for observation instruments,

Exposure measuring system for attachment cameras to microscopes provided with a focusing telescope which is provided with a transverse slot for the selective insertion of two sliders, one of which is provided at the approximate slider center with a photodetector for the exposure measuring system while the other consists of a transparent plate which bears a marking of circular shape or the like also approximately at the center of the slider and corresponding in size to that of the photodetector. The slot possibly serves only for the introduction of a single slider bearing both the photodetector and the marking a given distance apart and is correspondingly displaceable between two positions. The guide path (10) of the slider(s) (9) is displaceable in the plane of the slider and means (16) actuated from outside the focusing telescope are provided to cause slider displacement.

Exposure measuring system for microscope attached cameras

Microscope-attachment camera with a system for measuring the brightness of an object detail and with markings for indicating at least the detail metering-field and the image-field of the camera in the observation beam. The metering field-marking (14) and the image field-marking (22) are positioned on two separate plates, the metering field-marking plate being designed as a metering field-stop (14), and the two markings which differ in shape and size (14,22) are simultaneously reflected into the observation beam.

Growing community of inventors

Wetzlar, Germany

Herbert Leiter