Ropintassco Holdings, L.p.

Gatan, Inc.

Henry Shih-Ming Chao

Paul E Mooney

Colin Trevor

Paul Edward Mooney

Bernd Kraus

Colin Geoffrey Trevor

A charged particle device is provided comprising a charged particle source configured to direct charged particles in the direction of a specimen under examination and an imaging device configured to convert charged particles to an image representing the specimen. The imaging device comprises a detector defining a pixel array. The detector is configured to generate electric charges for individual pixels of the pixel array such that the electric charges collectively define the image. The imaging device is configured such that a portion of the pixel array can be transitioned between a partially masked state and a substantially unmasked state.

Growing community of inventors

Danville, CA, United States of America

Henry Shih-Ming Chao