The University of Toledo

Henry John Simon

Robert T Deck

Richard V Andaloro

Changes in optical properties of layered materials are measured by directing an incident wave of finite transverse dimensions toward layered materials under conditions that will produce a propagating surface mode or a waveguide mode in the layered materials. The intensity distribution is measured within the transverse beam profile of the total reflected beam. The profile shows asymmetric structure associated with the excitation of the propagating surface mode or a wave-guide mode. The index of refraction of the layered materials is modified and the reshaped intensity distribution within the transverse beam profile of the total reflected beam is again measured under the same incidence conditions. The measured intensity distributions are compared to detect differences in the indexes of refraction in the layered materials.

Method of measuring surface plasmon resonance using interference structure of reflected beam profile

A long range surface plasmon resonance sensor for use in biological, biochemical or chemical testing. The sensor includes a first dielectric medium and a second dielectric medium having an index of refraction approximately matching the first dielectric medium. A double-grating structure is located between the first dielectric medium and the second dielectric medium. A beam of electromagnetic radiation is introduced into the second dielectric medium in a manner which causes long range surface plasmon resonance to occur such that the beam of radiation suffers attenuated total reflection. The characteristics of the resonance dependent upon the reaction between the bonding layer and the targeted bonding molecule are then detected.

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Sylvania, OH, United States of America

Henry John Simon