Holtek Semiconductor Corp.

Holtek Microelectronics Inc.

Henry Fan

Jason Chen

Yi Lin

Bao-Shiang Sun

An integrated circuit is disclosed which includes a start test mode circuit for generating a test mode start-up signal to cause the integrated circuit to enter a test mode, and an automatic reset circuit responsive to the test mode start-up signal for preventing the integrated circuit from erroneously entering a test mode during normal operation.

Apparatus within an integrated circuit for preventing the integrated circuit from erroneously entering a test mode operation

A test method for charge redistribution type digital-to-analog and analog-to-digital converters by utilizing the special characteristics of a DAC or ADC such that the accuracy and linearity of the converted signal is only determined by the internal capacitance ratios of the converter, and that the accuracy and linearity are not related to the test reference voltage, the test voltage and the noise signal of the test machine. The test method utilizes a principle of capacitance comparison to directly compare the capacitance ratios in a converter in order to determine the accuracy and linearity of the converted signal. The present invention method enables an effective reduction in the test time and test steps required and an increase in the test efficiency.

Method for testing charge redistribution type digital-to-analog and

A data shift control circuit for a shift register in response to a logic operation command code is disclosed. The shift register includes a first register and a second register and the logic operation command code includes a first portion and a second portion. The circuit includes a first decoder for decoding the first portion to transmit a move signal; a second decoder for decoding the second portion to transmit a control signal; a control signal channel, electrically connected to the first register and the second register, for allowing the first register and the second register to receive the control signal and for allowing the shift register to execute a first action; and a move signal channel, electrically connected to all registers of the shift register for allowing the all registers to receive the move signal and for allowing the move register to execute a second action.

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Chung-Li, Taiwan

Henry Fan