Seagate Technology Incorporated

Henry Elwood Davenport

Don M Robinson

Jack William Lakey

Errol Carl Heiman

Robert James Hancock

An electronic device power testing method is provided in which applying a nominal voltage to an electronic component, introducing a voltage disruption to the nominal voltage, and repeating the voltage disruption for a specified number of instances is done. The present invention also can be implemented as an electronic device power tester.

Comprehensive application power tester

A method and apparatus for initiating and analyzing an error recovery procedure in a data storage device is disclosed. Error recovery procedures are initiated by the simulation of an injected error event onto a particular location of the storage device. The simulation is implemented by corrupting the differential read signal of the storage device prior to error detection and decoding by the storage device. The operation and control of the software error recovery analysis tool is administered through a software application offering a graphical and interactive environment for measurement and automation. The application, corruption device, and a circuit designed to operate the timing and control of the tool are linked such that communication between the components defines the invention as a whole. During the signal corruption, the application allows the monitoring of any responses to the simulated error events by the data storage device.

Tool for initiating and analyzing error recovery procedures in data storage devices

The defect list, as supplied by the manufacturer, is stored on the outer tracks of the disk. It is merged with the user supplied media defect list during formatting and used to flag defective sectors. During initialization the merged defect list is loaded into a section of dynamic memory so that it is accessible during seeking of a particular address.

Method for mapping around defective sectors in a disc drive

The defect list, as supplied by the manufacturer, is stored on the outer tracks of the disc. It is merged with the user-supplied media defect list during formatting and used to flag defective sectors. During initialization the merged defect list is loaded into a section of dynamic memory so that it is accessible during seeking of a particular address.

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Longmont, CO, United States of America

Henry Elwood Davenport