Foss Analytical A/s

Foss Analytical Ab

Henrik Vilstrup Juhl

Thomas Nikolajsen

Per Waaben Hansen

Maja Kirstine Elsoee

Hans Villemoes Andersen

Lars Noergaard

Joern Dalgaard Mikkelsen

Andreas Baum

Compensating for frequency drift of a reference energy source in an FT interferometer based spectrometer instrument may include obtaining data representing a reference interferogram collected in response to a trigger signal having been generated in dependence on the emission frequency of the reference energy source, and subsequently obtaining data representing a target interferogram recorded by the FT interferometer in response to a trigger signal also having been generated in dependence on the emission frequency of the reference energy source in the same manner. The method may further include comparing the obtained data to determine a phase shift between the interferograms in a window in at least one region away from center-burst, and generating a mathematical transform dependent on the determined shift to be subsequently applied to generate data representing a frequency stabilized interferogram of an unknown sample recorded by the FT interferometer.

Method of compensating frequency drift in an interferometer

A system () for determining properties of a sample () comprises a LIBS detector () and an infra-red absorption detector () for interrogating a sample () to generate LIBS spectral data and infra-red absorption spectral data respectively; and a data processor () adapted to apply at least one chemometric prediction model, each constructed to link, preferably quantitatively link, features of both LIBS and absorption spectral data to a different specific property of the sample, to a combined dataset derived from at least portions of both the LIBS and the absorption data to generate therefrom a determination, preferably a quantitative determination, of the specific property linked by that model.

System for and method of combined LIBS and IR absorption spectroscopy investigations

Compensating for amplitude drift in a spectrometer may include making successive performances of a standardization process to generate, at each performance, a mathematical transform to compensate for amplitude drift for application by an arithmetic unit to a spectrum obtained by the spectrometer in an interval between the performances. The compensating may include modifying the mathematical transform with a function dependent on spectral data from a zero material measured in association with the standardization process and the single beam zero spectrum measured in an interval between performances. The compensating may include applying the modified mathematical transform to a spectrum from an unknown sample.

Method for compensating amplitude drift in a spectrometer and spectrometer performing said method

An apparatus for spectrophotometric analysis comprises a sample reception surface, which is arranged to receive a sample to be analyzed, and a sample contacting surface, which is moveable in relation to the sample reception surface such that it may be brought to a first position, where the surfaces are sufficiently far apart to allow the sample to be placed on the sample reception surface, and a second position, where the sample contacting surface makes contact with the sample and compresses the sample. The apparatus further comprises a sample thickness controller, which is arranged to control the distance between the sample reception surface and the sample contacting surface in the second position of the sample contacting surface, such that a sample thickness between the surfaces may be shifted for obtaining at least two measurements of the sample at different optical path lengths through the sample.

Apparatus and method for spectrophotometric analysis

An apparatus for spectrophotometric analysis comprises a sample reception surface, which is arranged to receive a sample to be analysed, and a sample contacting surface, which is moveable in relation to the sample reception surface such that it may be brought to a first position, where the surfaces are sufficiently far apart to allow the sample to be placed on the sample reception surface, and a second position, where the sample contacting surface makes contact with the sample and compresses the sample. The apparatus further comprises a sample thickness controller, which is arranged to control the distance between the sample reception surface and the sample contacting surface in the second position of the sample contacting surface, such that a sample thickness between the surfaces may be shifted for obtaining at least two measurements of the sample at different optical path lengths through the sample.

A spectrophotometer () comprising a source of radiation (), preferably optical radiation, disposed to emit radiation at a plurality of wavelengths towards a sample in a sample holder () and a detection arrangementfor detecting the radiation after its interaction with the sample. The sample holder () is adapted to present a plurality of different path lengths for the emitted radiation through the sample. An arithmetic unit () is operably connected to receive an intensity dependent output from the detection arrangement () and is adapted to store an intensity value of the detected emitted radiation indexed to its wavelength at two or more path lengths of the plurality of different path lengths and to calculate a value dependent on the ratio of the indexed intensity values at each of two path lengths by which an indication of the presence of a substance of interest withiA spectrophotometer () comprise a source of radiation (), preferably optical radiation, disposed to emit radiation at a plurality of wavelengths towards a sample in a sample holder () and a detection arrangementfor detecting the radiation after its interaction with the sample. The sample holder () is adapted to present a plurality of different path lengths for the emitted radiation through the sample. An arithmetic unit () is operably connected to receive an intensity dependent output from the detection arrangement () and is adapted to store an intensity value of the detected emitted radiation indexed to its wavelength at two or more path lengths of the plurality of different path lengths and to calculate a value dependent on the ratio of the indexed intensity values at each of two path lengths by which an indication of the presence of a substance of interest within the retained sample can be obtained.

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Roskilde, Denmark

Henrik Vilstrup Juhl