Jabil Optics Germany Gmbh

Solarion Ag

Oc3 Ag

Hendrik Zachmann

Norbert Leclerc

David Musick

Frank Scholze

Karsten Otte

Horst Neumann

Lutz Pistol

Heiko Schuler

Christof GÖBERT

Frank Huber

Jens RÖSSLER

Frank Ulmer

Oliver Leifeld

The present invention refers to a surround-view imaging system for time-of-flight (TOF) depth sensing applications and a time-of-flight sensing based collision avoidance system comprising such an imaging system. The imaging system for time-of-flight depth sensing applications comprises a lens system, adapted for imaging angles of view (AOV) larger than 120&#xb0; in an image on an image plane; a sensor system, adapted to convert at least a part the image in the image plane into an electronic image signal; and an evaluation electronics, adapted to analyze the electronic image signal and to output resulting environmental information; wherein the lens system and/or the sensor system are designed for specifically imaging fields of view (FOV) starting at zenithal angles larger than 60&#xb0;.

Surround-view imaging system

The invention relates to a method and a device for producing a semiconductor layer. The problem addressed is that of increasing the deposition rate of the layer constituents and significantly improving the efficiency of a resulting solar cell. At the same time, the material costs are intended to be reduced. The problem is solved by virtue of the fact that, in a vacuum chamber, metal evaporator sources release Cu, In and/or Ga or the chalcogenide compounds, the latter are focused as metal vapor jets onto the substrate, and Se and/or S emerge(s) in an ionized fashion from a chalcogen low-energy wide-beam ion source and this beam is focused onto the surface of the substrate in such a way that it overlaps the metal vapor jets. A device for carrying out the method is described.

Method and device for producing a semiconductor layer

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Leipzig, Germany

Hendrik Zachmann