Technische Universiteit Delft

Hennyz B.v.

U.S. Philips Corporation

Fei Comapny

Carl Zeiss Microscopy Gmbh

Stichting Voor De Technische Wetenschappen

Hendrik Willem Zandbergen

Maria Rudneva

Pleun Dona

Diederik Jan Maas

Gerardus Nicolaas Anne Van Veen

Pasqualina Maria Sarro

Emile Van Veldhoven

Anthonius Van Veen

Tatiana Kozlova

Jan Fredrik Creemer

The present invention is in the field of a vacuum transfer assembly, such as for cryotransfer, and specifically a TEM vacuum transfer assembly, which can be used in microscopy, a sample holder, a vacuum housing, a sample holder stage and a sample holder coupling unit for use in the assembly, and a microscope comprising said assembly as well as a method of vacuum transfer into a microscope.

Vacuum transfer assembly

The present invention is in the field of a cryo transfer system for use in microscopy, and a microscope comprising said system. The present invention is in the field of microscopy, specifically in the field of electron and focused ion beam microscopy (EM and FIB), and in particular Transmission Electron Microscopy (TEM). However its application is extendable in principle to any field of microscopy, especially wherein a specimen (or sample) is cooled or needs cooling.

Cryotransfer system

An improved microreactor for use in microscopy, use of said microreactor, and a microscope comprising said reactor. The present invention is in the field of microscopy, specifically in the field of electron and focused ion beam microscopy (EM and FIB), and in particular Transmission Electron Microscopy (TEM). However its application is extendable in principle to any field of microscopy, especially wherein characteristics of a (solid) specimen (or sample) are studied in detail, such as during a reaction.

Microreactor for use in microscopy

A low specimen drift holder and cooler for use in microscopy, and a microscope comprising said holder. The present invention is in the field of microscopy, specifically in the field of electron and focused ion beam microscopy (EM and FIB). However it application is extendable in principle to any field of microscopy, especially wherein a specimen is cooled or needs cooling.

Low specimen drift TEM holder and cooler for use in microscopy

A microreactor for use in a microscope, comprising a first and second cove layer (), which cover layers are both at least partly transparent to an electron beam () of an electron microscope, and extend next to each other at a mutual distance from each other and between which a chamber () is enclosed, wherein an inlet () and an outlet () are provided for feeding fluid through the chamber and wherein heating means () are provided for heating the chamber and/or elements present therein.

Microreactor for a transmission electron microscope and heating element and method of manufacture thereof

A holder assembly comprises a first and a separable second part, the first part detachable from the second part, the first part comprising a tube and an environmental cell interface and the second part comprising an electron microscope interface, as a result of which the first part can be cleaned at high temperatures without exposing the second part to said high temperature. By forming the holder assembly from detachable parts, one part can be cleaned by heating it to a high temperature of, for example, 1000&#xb0; C., clogging in the tubes can be removed by reduction of carbon, while keeping the other part (often comprising mechanical fittings, ball bearing, sliders, or such like) cool. The cleaning can be enhanced by blowing, for example, oxygen or hydrogen through the tubes.

Holder assembly for cooperating with an environmental cell and an electron microscope

A nanobridge or microbridge comprising a non-magnetic alloy of at least a first and second metal, the metals being selected from Group 8, 9, 10 and 11, wherein the first metal is present in a range of 50-95 wt. %, and memristors comprising one or more of same.

Memristor with nanobridge structure

Disclosed are methods for preparing samples that include forming a first channel in a material by directing a first plurality of noble gas ions at the material, forming a second channel in the material by directing a second plurality of noble gas ions at the material, where the second channel is spaced from the first channel so that a portion of the material between channels has a mean thickness of 100 nm or less, and detaching the portion from the material to yield the sample.

Sample preparation

A specimen holder for an electron microscope, comprising a rod-shaped part, which is provided near one end with a tip, which tip is arranged to receive a specimen, the rod-shaped part, in use, extending with at least the tip into the electron microscope, held by clamping means present in the electron microscope, wherein first temperature control means are provided to control the temperature of the rod-shaped part and/or the clamping means, such that this rod-shaped pan and the clamping means substantially have the same temperature, at least at the location of their contact surfaces.

Specimen holder for an electron microscope and method for reducing thermal drift in a microscope

A method and device for preparing a specimen of material for examination by a particle-optical microscope apparatus such as a high-resolution electron microscope (HREM). The known ion milling technique enables specimens to be made sufficiently thin so as to be electron-transparent, that being a condition for HREM materials examination. However, that results in amorphous material on the surface of the specimen which may cause blurring of the image of the surface and also lead to incorrect materials analysis. In accordance with the invention, the surface of the specimen is subjected, possibly following ion milling, to ion bombardment from a plasma of ionized gas which is formed adjoining such surface. This achieves ion etching of the surface, and consequent reduction of the thickness of the specimen, without formation of disturbing amorphous regions on the surface.

Growing community of inventors

Katwijk, Netherlands

Hendrik Willem Zandbergen