Globalfoundries Inc.

Hendrik Thomas Mau

Dirk Fimmel

Guntram Jummel

Torsten Schaefer

Methods and systems are provided for computing IR drop, i.e., voltage drop, in a semiconductor device. The method includes generating a modeling element corresponding to the plurality of transistors. At least one of the transistors in the modeling element is replaced with a current source. The method also includes performing an IR drop analysis of the modeling element utilizing a software program to calculate the IR drop in the semiconductor device.

Systems and methods for semiconductor voltage drop analysis

An exemplary embodiment of a system and a method for generating a wire model is provided. The system comprises a processor coupled to a display device, a user input device, and a storage device. The processor is configured to (1) generate a wire configuration file, (2) determine parasitic component values from the wire configuration file, and (3) construct a table model from the parasitic component values.

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Dresden, Germany

Hendrik Thomas Mau