Freescale Semiconductor,inc.

Nxp Usa, Inc.

Hemant Nautiyal

Prabhjot Singh

Amit Rao

Arvind Kaushik

Shreya Singh

Jehoda Refaeli

Anurag Jindal

Rajan Kapoor

Joseph Rollin Wright

Puneet Khandelwal

David Baca

Nipun Mahajan

Ankush Sethi

Amar Nath Deogharia

Ashish Kumar Gupta

Rohan Poudel

Shruti Singla

Jan Chochola

Dhruv Satsangi

Nitin Gera

A control system, that includes a primary controller and various auxiliary controllers, is configured to facilitate a built-in self-test (BIST) of a system-on-chip (SoC). The primary controller is configured to initiate a BIST sequence associated with the SoC. Based on the BIST sequence initiation, each auxiliary controller is configured to schedule execution of various self-test operations on various functional circuits, various memories, and various logic circuits of the SoC by various functional BIST controllers, various memory BIST controllers, and various logic BIST controllers of the SoC, respectively. Based on the execution of the self-test operations, each auxiliary controller further generates various status bits with each status bit indicating whether at least one functional circuit, at least one memory, or at least one logic circuit is faulty. Based on the status bits generated by each auxiliary controller, a fault diagnosis of the SoC is initiated.

System and method for facilitating built-in self-test of system-on-chips

A fault collection and reaction system on a system-on-chip (SoC) includes a plurality of reaction cores assigned to a plurality of applications being executed by a plurality of processor cores on the SoC, at least one look-up table (LUT), and a controller. The at least one LUT stores therein a first mapping between the plurality of reaction cores and corresponding plurality of domain identifiers, and a second mapping between a plurality of faults and a set of reaction combinations. The controller receives a fault indication and a first domain identifier in response to occurrence of a first fault and selects from the plurality of reaction cores, a first reaction core mapped to the first domain identifier, and from the set of reaction combinations, a first reaction combination mapped to the first fault. The first reaction core responds to the fault indication with a reaction based on the selected reaction combination.

Method and system for fault collection and reaction in system-on-chip

A processing system, such as for an automobile, includes multiple processor cores, including an application core and a safety core, and a fault detection circuit in communication with the processor cores. The fault detection circuit includes a progress register for storing progress data of an application executed on the application core. The safety core, which executes a fault detection program, reads the progress data from the progress register, and generates an output based on the progress data and an expected behavior of the application. The safety core writes the output to a status register of the fault detection circuit. The fault detection circuit includes a controller that reads the status register and generates a fault signal when the output indicates there is a fault in the execution of the application. In response, the application core either recovers from the fault or runs in a safe mode.

Fault detection circuit with progress register and status register

A communication system for communicating control data between a processor and an interface includes configuration registers, a packet processor, an interrupt processor, a timing monitor, a configuration sampler, a control-frame processor, a mode selector, and a transceiver. The processor, timing monitor, and configuration sampler generate control data, a timing signal and frame structure data, respectively. The packet processor generates a transmit control configuration packet, which includes the control data. The control-frame processor inserts the transmit control configuration packet into a first control frame, outputs the control frame to the interface and extracts a receive-configuration packet from a second control frame for generating one or more interrupts. The mode selector generates mode and idle signals for determining the mode of the interface, based on the idle signal. In one implementation, the system uses JESD control frames to reduce GPIO pin usage.

Communication system for transmitting and receiving control frames

A system provides synchronous read data sampling between a memory and a memory controller, which includes an asynchronous FIFO buffer and which outputs a clock and other control signals. An outbound control signal (e.g., read_enable) is used to time-stamp the beginning of a read access using a clock edge counter. The incoming read data is qualified based on the time-stamped value of the read_enable signal plus typical access latency by counting FIFO pops. The system performs correct data sampling irrespective of propagation delays between the controller and memory. The system may be implemented in a System on a Chip (SOC) device having a synchronous communication system.

Memory controller

A method and system for booting an electronic device from a NAND flash memory includes a NAND flash controller that receives an event trigger for fetching a pre-boot code stored in the NAND flash memory. Based on the event trigger type, booting parameters are loaded into the controller including a boot frequency of the NAND flash memory. The controller searches for a good memory block in which the pre-boot code is stored by checking the first and second or the first and last pages of a memory block and fetches a portion or the entire pre-boot code based on the event trigger type at the boot frequency.

Method and system for booting electronic device from NAND flash memory

A system and a method for configuring a memory controller that communicates with a memory device muxes selected pins for the data transfer. The memory controller includes a set of pins where each pin of the set is associated with a data bit and an address bit. A programmable logic block is connected to the set of pins and uses a subset of the set of pins to enable data transfer between the memory device and the memory controller depending on the size of the memory device such that the pins not included in the subset are available for other applications.

Memory controller address and data pin multiplexing

A method for interfacing an out-of-order bus and multiple ordered buses and a bus bridge. The bus bridge includes multiple ordered bus interfaces, where each ordered bus interface is coupled to an ordered bus. A flow control logic circuit is coupled to the out-of-order bus and to the multiple ordered bus interfaces. The flow control logic circuit controls a flow of transaction requests between the out-of-order bus and each of the ordered buses interfaces. The flow control logic circuit includes an updating circuit for updating dependency resolution attributes and data readiness attributes associated with transaction requests, and a shared memory unit for storing the dependency resolution attributes, the data readiness attributes and the transaction requests where the transaction requests are destined to the ordered buses. A managing circuit, coupled to the shared memory unit and to the multiple ordered bus interfaces, is used to determine a readiness of each transaction request based on a dependency resolution attribute and a data readiness attribute associated with the transaction request, and for managing a dequeueing of ready transaction requests to the ordered bus interfaces based on an availability of the ordered bus interfaces.

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Noida, India

Hemant Nautiyal