National Instruments Corporation

Helmut J Helpenstein

Andreas Peter Haub

Stefan Romainczyk

Andreas Krantz

Myrle H Krantz

Ralf Deininger

Eva Wolpers

David Mark Pierce

Guy Vachon Laborde

A method and system is presented which provides a TDM framework for managing self-describing measurement data. The TDM framework provides applications with a central platform for accessing measurement data across an entire enterprise system. By means of individual plug-ins, which may be specific to a given data file format, meta-data for each data store in the enterprise may be indexed in a unified manner. The unified indexing, in turn, provides the ability to browse and query the indexed measurement data without requiring the opening or reading from a source data file.

Interactively setting a search value in a data finder tool

A method and system is presented which provides a TDM framework for managing self-describing measurement data. The TDM framework provides applications with a central platform for accessing measurement data across an entire enterprise system. By means of individual plug-ins, which are specific to a given data file format, meta-data for each data store in the enterprise may be indexed in a unified manner. The unified indexing, in turn, provides the ability to browse and query the indexed measurement data without requiring the opening or reading from a source data file.

Method for intelligent storing and retrieving in an enterprise data system

Configuration of optimized custom properties in a data finder tool

Intelligent storing and retrieving in an enterprise data system

Method for indexing file structures in an enterprise data system

Method for intelligent browsing in an enterprise data system

A system and method for storing measurements. Each measurement may include bulk data and attribute data. The bulk data and the attribute data may be stored using different storage mechanisms. In one embodiment, relational database technology may be used to store the attribute data. Relational database technology may facilitate querying or searching on the attribute data. The bulk data may be stored in a database specialized for storing bulk data.

Optimized storage for measurement data

Growing community of inventors

Aachen, Germany

Helmut J Helpenstein