Leica Microsystems Heidelberg Gmbh

Leica Microsystems Cms Gmbh

Leica Lasertechnik Gmbh

Heinrich Ulrich

Johann Engelhardt

Werner Knebel

Kyra Moellmann

Holger Birk

William C Hay

Rafael Storz

Juergen Hoffmann

Peter Euteneuer

Joachim Bradl

Andreas Hecker

Volker Leimbach

Hilmar Gugel

Ingo Boehm

Joerg Bewersdorf

Juergen Riedmann

Ingo Böhm

Rolf Borlinghaus

Thomas Zapf

Klaus Kierschke

Holger Nissle

A light source and/or a deflector and/or the emitting end of an illuminating optical fiber is arranged in the rear focal plane of a lens for total internal reflection microscopy.

Lens for evanescent wave illumination and corresponding microscope

A device for examining and manipulating microscopic objects with a microscope having a light source that serves to illuminate the object, and which generates an illumination light beam that runs along and illumination beam path, that can be guided over or through the object by means of a beam deflector, with a detector to detect light emitted from the object that runs along the detection beam path, with a primary beam splitter, and with a light source, which generates a manipulation light beam that runs along an illumination beam path, that serves to manipulate the object.

Device for examining and manipulating microscopic objects with coupled illumination and manipulation light beams

A scanning microscope includes a light source, illumination optics, and a scanning device for moving the illumination focus across a target region and doing so by varying the direction of incidence in which the illuminating beam enters an entrance pupil of the illumination optics. To incline the illumination focus relative to the optical axis of the optics, the scanning device directs the illuminating beam onto a portion of the entrance pupil that is offset from the center of the pupil and, in order to move the illumination focus across the target region, the scanning device varies the direction of incidence of the illuminating beam within said portion. An observation objective is provided which is spatially separated from the illumination optics and disposed such that its optical axis (O) is substantially perpendicular to the target region and at an acute angle (&#x3b1;) to the optical axis (O) of the illumination optics.

Scanning microscope and method for light-microscopic imaging of an object

A microscope objective includes an optical fiber. The optical fiber can deliver light for total internal reflection microscopy. The optical fiber can couple illumination light directly into the microscope objective through the optical fiber.

Microscope lens for total internal reflection microscopy and microscope

A microscope with a light source that produces an illumination light beam for evanescently illuminating a sample includes an adjustment mechanism with which the polarization of the illumination light beam may be changed.

Illumination module for evanescent illumination and microscope

A scanning microscope includes at least one light source, an acousto-optical element, a beam deflection device and a beam guiding device. The at least one light source generates an illuminating light beam. The acousto-optical element spatially splits a sub-light beam from the illuminating light beam and adjusts an optical power of the illuminating light beam. The beam deflection device scans the illuminating light beam over or through a sample. The beam guiding device directs the sub-light beam onto the sample.

Scanning microscope

A microscope with evanescent sample illumination and a method for testing samples are disclosed. A first evanescent field, which exhibits a first penetration depth in the sample, and a second evanescent field, which exhibits a second penetration depth in the sample that is greater than the first penetration depth, are produced. A detector is provided that detects the first detection light, which exits from the part of the sample illuminated with the first evanescent field, and which produces first detection light data therefrom, and the second detection light, which exits from the part of the sample illuminated with the second evanescent field, and which produces second detection light data therefrom. Furthermore, a processing module is provided for processing the first and second detection light data.

Method for analyzing a sample and microscope for evanescently illuminating the sample

The invention relates to a microscope comprising at least one first and second light sources, a first light-guiding fiber connected to the first light source and a second light-guiding fiber connected to the second light source, wherein the light emitted by corresponding light source is injectable into the connected light-guiding fiber. The inventive microscope also comprises an objective lens disposed in the illumination beam path and is characterized in that a fiber multiplexer connected to the first and second light-guiding fibers, receiving the light from the light source and selectively allowing the light from the first or second light source to pass is disposed in the illumination beam path.

Microscope

A microscope comprises an objective and a light source that produces an illumination light beam&#x2014;in particular for evanescent illumination of a sample, which exhibits a focus in the plane of the objective pupil. To adjust the penetration depth, an adjustment mechanism is provided with which the spatial position of the focus within the plane of the objective pupil may be changed.

Objective for evanescent illumination and microscope

A microscope with evanescent sample illumination comprises a device for optically manipulating a sample.

Microscope with evanescent sample illumination

A scanning microscope includes a light source for evanescently illuminating a sample disposed on a slide. A point detector receives detection light emanating from a scanning point of the sample. A beam deflection device disposed in an optical path of the detection light can shift a position of the scanning point.

Scanning microscope with evanescent wave illumination

A microscope with a first and a second illumination light beam for illuminating a sample, wherein the first and/or the second illumination light beam evanescently illuminates the sample. For the purpose of CARS testing, the first illumination light beam can be a pump light beam, and the second illumination light beam can be a Stokes light beam. To increase resolution, the first illumination light beam can be an excitation light beam, and the second illumination light beam can be a stimulation light beam.

Microscope with evanescent wave illumination

A microscope includes an adjustment device for positioning a specimen stage. An objective, an objective changer and/or an objective turret is coupled to the adjustment device so that a position of the objective element is adjustable by the adjustment device. A holder for the objective element may be provided coupling the objective element to the adjustment device.

A scanning microscope has a light source that emits illuminating light for illumination of a specimen, at least one first detector for detection of the detected light proceeding from the specimen, an objective arranged in both an illumination beam path and a detection beam path, and a coupling-out element that is selectably for descan detection and non-descan detection positionable in the illumination and detection beam path. A light-guiding fiber is provided for transporting at least a portion of the detection light from the coupling-out element to the first detector.

Scanning microscope and coupling-out element

An apparatus for determining the light power level of a light beam ( ), having a beam splitter ( ) and a detector ( ) associated with the beam splitter ( ), is disclosed. The apparatus is characterized in that the beam splitter ( ) splits measuring light ( ) out of the light beam and conveys it to the detector ( ), and that the ratio between the light power level of the light beam ( ) and the light power level of the measuring light ( ) measured at the detector ( ) is constant over time.

Growing community of inventors

Heidelberg, Germany

Heinrich Ulrich