Carl Zeiss Microscopy Gmbh

Carl Zeiss Microimaging Gmbh

Carl Zeiss Ag

Carl Zeiss Nts Gmbh

Heino Heise

Ulrich Kohlhaas

Uwe Wolf

Martin Edelmann

Peter Dietrich

Andreas Nolte

Christian Thomas

Michael Brehm

Dmitry Lysenkov

An alignment marker unit for an object holder for microscopic imaging of an object with a microscope, wherein the alignment marker unit can be removed from and remounted on the object holder, wherein the alignment marker unit has at least one alignment marker for microscope-supported detection, and wherein the alignment marker is designed to determine a coordinate system for the object holder which allows for the microscope-supported calibration of the object or an area of the object relative to its position to the object holder and the position of the object holder relative to the microscope. Furthermore, an object holder system including an object holder and an alignment marker unit as described above is provided.

Exchangeable alignment marker unit

A filter holder for correlative particle analysis during imaging microscopy methods or methods of the elemental analysis including a receiving element with a filter support and a fastening unit. The plane filter support is designed as pressure piece and is movably arranged in the receiving element to be movable at a right angle to the surface of the filter for the purpose of tensioning the filter. The fastening unit includes a clamping element which encloses the filter at the circumference of the filter and is held by a tensioning element which is supported in the receiving element.

Filter holder for correlative particle analysis

For the microscopy of an object or a specimen with a combination of optical microscopy and particle beam microscopy, an electrically conducting specimen carrier () is used which is configured for use in a particle beam microscope as well as in an optical microscope and has at least one alignment mark (). The alignment mark is configured as a pass-through structure and is detectable from the top and from the bottom of the specimen carrier.

Specimen holder having alignment marks

A condenser arrangement for brightfield illumination and/or darkfield illumination for optical microscopes comprises in a housing basic optics having at least one lens, at least one front optics which can be inserted into the illumination beam path in front of the basic optics, and means for inserting the front optics into the illumination beam path of the microscope. A first swiveling arm and a second swiveling arm are swivelably arranged at the housing of the condenser. The first swiveling arm carries first front optics with a high aperture for brightfield illumination and the second swiveling arm carries second front optics for darkfield illumination. The two swiveling arms are arranged at a defined distance from the shared basic optics of the condenser in direction of the optical axis of the illumination beam path. An aperture iris diaphragm is provided on the object side in front of the basic optics and is opened when the cardioid optics are inserted. Further, a darkfield slide with an annular mirror element is provided on the object side at the housing. Operator's controls serve to swivel the two swiveling arms for moving the darkfield slide and for adjusting the aperture iris diaphragm.

Condenser arrangement for brightfield illumination and/or darkfield illumination for optical microscopes

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Adelebsen, Germany

Heino Heise