Anton Paar Gmbh

Heimo Schnablegger

Josef Gautsch

Wolfgang Gigerl

A method and a device examine a sample with radiation emitted from a radiation source, which is directed to the sample carried by a sample holder via a beamforming unit and detected by a detector and evaluated in an evaluating unit. Prior to the examination of the sample, at least one of the following components, including the radiation source, beamforming unit, sample holder, detector, and a primary beam stop, are spatially oriented and/or positioned in relation to at least one of the other components and/or in relation to a predefined fixed point and/or in relation to the optical path with a control unit via actuating drives. The radiation intensity measured by the detector, in a predefined detector range, and/or a value derived therefrom is used for establishing a control variable conferred from the control unit to the actuating drives assigned to the components.

Method and apparatus for analysis of samples

The invention relates to a method and an apparatus for studying the X-ray properties of samples (), wherein X-ray radiation scattered by a sample () is recorded by a detector () positioned at a distance from the sample () and is evaluated with respect to the characteristics of the sample. According to the invention, it is provided that at a predetermined distance between the X-ray beam source () and the detector () or between the starting point () of the X-ray beam () directed at the sample () and the detector (), for a predetermined number of successive measurements the distance (S, S) between the sample () and the detector () is changed and is set at a predetermined different value.

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Graz, Austria

Heimo Schnablegger