Trinamix Gmbh

Basf Se Corporation

Heiko Hengen

Robert Send

Ingmar Bruder

Patrick Schindler

Peter Schillen

Christian Lennartz

Michael Eberspach

Lars Diesselberg

Friedrich Schick

Christian Bonsignore

Jakob Unger

Andre Schmidt

Sebastian Valouch

Erwin Thiel

Stephan Irle

Described herein are systems including a structured light projector, a semiconductor detector, and a processor. Also described herein is a non-transitory computer readable medium storing executable instructions. The systems and non-transitory computer readable medium are configured to output a signal including information related to the classification of an object.

Detector for identifying at least one material property

Described herein is a detector for identifying at least one material property m. The detector includes at least one sensor element including a matrix of optical sensors, the optical sensors each having a light-sensitive area. The sensor element is configured for recording at least one reflection image of a light beam originating from at least one object. The detector includes at least one evaluation device configured for determining the material property m by evaluation of at least one beam profile of the reflection image and evaluation of a material feature φ2m.

Described herein is a detector for identifying at least one material property m. The detector includes at least one sensor element including a matrix of optical sensors, the optical sensors each having a light-sensitive area. The sensor element is configured for recording at least one reflection image of a light beam originating from at least one object. The detector includes at least one evaluation device configured for determining the material property m by evaluation of at least one beam profile of the reflection image and evaluation of a material feature ϕ2m.

Described herein is a detector for identifying at least one material property m. The detector includes at least one sensor element including a matrix of optical sensors, the optical sensors each having a light-sensitive area. The sensor element is configured for recording at least one reflection image of a light beam originating from at least one object. The detector includes at least one evaluation device configured for determining the material property by evaluation of at least one beam profile of the reflection image.

A detector for determining a position of at least one object is provided. The detector includes an evaluation device adapted to select at least one reflection feature of a reflection image, wherein the evaluation device is configured for determining at least one longitudinal region of the selected reflection feature of the reflection image by evaluating a combined signal Q from the sensor signals, wherein the evaluation device is adapted to determine at least one displacement region in at least one reference image corresponding to the longitudinal region, wherein the evaluation device is adapted to match the selected reflection feature with at least one reference feature within the displacement region.

Detector for determining a position of at least one object

A detector for determining a position of at least one object is disclosed and includes at least one sensor element having a matrix of optical sensors, the optical sensors each having a light-sensitive area. Each optical sensor is designed to generate at least one sensor signal in response to an illumination of its respective light-sensitive area by a light beam propagating from the object to the detector. The sensor element is adapted to determine at least one reflection image. The detector also includes at least one evaluation device adapted to select at least one reflection feature of the reflection image at least one first image position in the reflection image. The evaluation device is adapted to determine at least one reference feature in at least one reference image and at least one second image position in the reference image corresponding to the at least one reflection feature.

Detector for determining a position of at least one object comprising at least one device to determine relative spatial constellation from a longitudinal coordinate of the object and the positions of reflection image and reference image

A method of controlling pixels () of at least one spatial light modulator () is disclosed. The spatial light modulator () has a matrix of pixels (). Each pixel () is individually controllable. The method comprises the following steps: receiving at least one image (), (); defining at least one image segment () within the image (),(); assigning at least one gray scale value to each image segment (),(); assigning at least one pixel () of the matrix of pixels () to each image segment (),(); assigning a unique modulation frequency to each gray scale value assigned to the at least one image segment (),(); controlling the at least one pixel () of the matrix of pixels () assigned to the at least one image segment () with the unique modulation frequency assigned to the respective image segment (),().

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Kandel, Germany

Heiko Hengen