Freescale Semiconductor,inc.

Heiko Ahrens

Markus Regner

Vladimir Vorisek

Andreas Stahl

Claudia Latzel

Bernhard Richter

Vladimir Litovchenko

IC device comprising a plurality of functional components arranged into self-test cells. The IC device is configurable into a first self-test configuration comprising a first set of self-test partitions. Each self-test partition within the first set comprising at least one self-test cell. Functional components of the self-test cell(s) of each self-test partition within the first set are arranged to be configured into at least one scan-chain for said self-test partition when the IC device is configured into the first self-test configuration. The IC device is configurable into a second self-test configuration comprising a second set of self-test partitions. Each self-test partition within the second set comprising at least one self-test cell. Functional components of the self-test cell(s) of each self-test partition within the second set are arranged to be configured into at least one scan-chain for said self-test partition when the IC device is configured into the second self-test configuration.

Integrated circuit device and method of performing self-testing within an integrated circuit device

A circuit arrangement for Logic Built-In Self-Test (LBIST) includes a clock source configured to generate a system clock, a first clock division circuitry configured to derive a first punched-out clock and a plurality of scan chains operable at the first punched-out clock. Each scan chain has an associated output circuitry responsive to a leading edge of the first punched-out clock. The circuit arrangement includes a second clock division circuitry configured to derive a second punched-out clock. The second punched-out clock has a delay of one or more system clock periods relative to the first punched-out clock. A compacting logic is configured to compact signals received from the scan chains. A sequential retiming element connects the compacting logic to an input circuitry of a MISR. The sequential retiming element is responsive to a trailing edge of the second punched-out clock. The input circuitry is responsive to a leading edge of the second punched-out clock.

Circuit arrangement for logic built-in self-test of a semiconductor device and a method of operating such circuit arrangement

An integrated circuit device comprising at least one self-test component arranged to execute self-testing within at least one self-test structure during a self-test execution phase of the IC device, and at least one clock control component arranged to provide at least one clock signal to the at least one self-test component at least during the self-test execution phase of the IC device. The at least one clock control component is further arranged to receive at least one indication of at least one power dissipation parameter for at least a part of the IC device, and modulate the at least one clock signal provided to the at least one self-test component based at least partly on the received at least one power dissipation parameter for at least a part of the IC device.

Integrated circuit device and method therefor

An integrated circuit (IC) device, and method therefor, the IC device comprising a plurality of self-test components arranged to execute self-tests in parallel during a self-test execution phase of the IC device, and at least one clock control component arranged to provide at least one clock signal to the plurality of self-test components at least during the self-test execution phase of the IC device. The at least one clock control component is further arranged to receive at least one indication that self-testing has ceased within at least a first self-test component, and dynamically modulate the at least one clock signal provided to at least one further self-test component for which self-testing has not ceased to increase a clock rate of the at least one clock signal upon receipt of an indication that self-test execution has ceased within the at least first self-test component.

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Munich, Germany

Heiko Ahrens