Outokumpu Oy

Hs Foils Oy

Metorex International Oy

Bruker Axs Handheld, Inc.

Outokumpu Instruments Oy

Heikki Sipila Oy

Heikki J Sipila

Marja-Leena Jarvinen

Seppo J Uusitalo

Pekka Torma

Pasi Antero Kostamo

Erkki Sakari Kiuru

Arttu Luukanen

Tuomo V Kivisto

Marco Ilmari Mattila

Erkki Tapani Puusaari

Jari Kostamo

Georg C Von Alfthan

Esko Juhani Kantonen

Heimo J Heino

Esa Kostamo

Jouko A Koskinen

Tuula A Lukander

Pekka Rautala

Seppo Vaijarvi

Veli-Pekka Viitanen

Lasse J Rinta-Keturi

Seppo V Koskinen

Pertti T Lehtonen

Karl O Salminen

Kai J Laamanen

Sakari Viitamaki

The invention relates to a gas drift detector () comprising: a chamber formed by: a housing () having a first end and a second end; a radiation window () arranged to cover an opening of the first end of the housing (); and a substrate () arranged to cover an opening of the second end of the housing (), an anode () arranged to the substrate (), one or more conductive rings () arranged on a surface () of the substrate facing inside the chamber, and an amplifier () arranged to the opposite surface () of the substrate than the conductive rings (). The amplifier () is electrically connected to the anode (). The chamber is filled with a gas.

Gas drift detector

For manufacturing a radiation window for an X-ray measurement apparatus, an etch stop layer is first produced on a polished surface of a carrier. A thin film deposition technique is used to produce a boron carbide layer on an opposite side of the etch stop layer than the carrier. The combined structure including the carrier, the etch stop layer, and the boron carbide layer is attached to a region around an opening in a support structure with the boron carbide layer facing the support structure. The middle area of carrier is etched away, leaving an additional support structure.

Method for manufacturing radiation window and a radiation window

A radiation window foil is provided for an X-ray radiation window. It includes a continuous window layer with a first side and a second side. A first mesh or grid layer is stacked on or bonded to the first side of the continuous window layer. A second mesh or grid layer is stacked on or bonded to the second side of the continuous window layer.

Reinforced radiation window, and method for manufacturing the same

A radiation detector assembly and a method for using the same are provided. The radiation detector assembly includes an aperture, a window covering the aperture, the window is configured to permit radiation to pass through, the window is configured to prevent the passage of fluids and particles through the aperture, and a protective device covers the window. The protective device includes a plurality of holes at least partially aligned with the aperture, is configured to permit at least some radiation to pass through the holes, is configured to prevent objects larger than the holes to contact the window and is configured to withstand external forces and prevent those forces from damaging the window.

Apparatus for protecting a radiation window

The invention relates to detection performed over millimeter and submillimeter wavelengths, especially to imaging solutions functioning over a submillimeter-wavelength range. The system of the invention uses detectors, comprising antenna coupled bolometers together with wavelength selective optics. The detector matrix is preferably curved for reducing the number of imaging errors. In order to provide a curved detector matrix, the detector matrix is constituted by flat submatrices, each being provided with one or more integrated antenna coupled bolometers. The detectable frequency range is preferably limited in two stages, first by means of wavelength selective optics and secondly by means of the operating band of the antenna of an antenna coupled bolometer. In order to focus the incoming radiation on bolometers, the bolometer substrate is fitted or the surface or interior of the bolometer substrate is provided with a bolometer lens or a corresponding optical element in alignment with each bolometer.

Imaging system functioning on submillimeter waves

The invention relates to X-ray fluorescence measuring systems, more specifically to methods for producing polarized X-radiation. The invention is based on the idea of using beryllium as the anode material despite its poor effectiveness. Some of the X-radiation spectrum produced by a beryllium anode is polarized radiation, more specifically its high-energy portion. The system of the invention involves filtering out the low-energy portion of the spectrum, whereby the remaining intensely polarized radiation can be used as excitation radiation in X-ray fluorescence measurements. The system of the invention is capable of achieving a certain intensity of polarized X-radiation by means of an X-ray tube less powerful than those used in common prior art solutions based on the use of scattering media.

X-ray fluorescence measuring system making use of polarized excitation

The invention relates to a method and apparatus for providing cooling in a reloadable cooling apparatus, which can be used in actuators requiring low temperatures. According to the invention, the loading of at least one cooling element (2, 22, 32), located in the vacuum of the cooling apparatus, is carried out through at least one cooling surface (4, 25, 34), connected to outside the cooling apparatus (1, 21, 31), and the period between two loadings is extended by reducing the transversal area of the supporting member (3, 23, 33) and by reducing the heat conduction distance of the supporting member (3, 23, 33) of the cooling element from the cooling apparatus (1, 21, 33), advantageously by shaping the supporting member (3, 23, 33).

Method for providing cooling and a cooling apparatus suited for the same

Analyzing sludgy materials by exposing the flowing material in continuous action to x-ray radiation and by measuring the radiation thus created in the said material, according to the invention, the radiation emitted from the material is measured with respect to the intensities of both x-ray fluorescence radiation and x-ray diffraction radiation, and these intensities are combined in order to form a parameter which describes the proportions of the partial components in a given compound combination. Moreover, the detectors employed in the measurement of the radiation intensities are placed at the same cross-sectional plane of the analyzer.

Method and apparatus for analyzing sludgy materials

The invention relates to a method for heating a gas phase stabilizer (5) installed within a gas-filled proportional counter (1) in order to activate the stabilizer (5). According to the invention, the heat is conducted into the proportional counter (1) along a thermal inlet (3), which is in thermal exchange contact with the stabilizer (5). The thermal inlet (3) employed in forming the gas filling can advantageously be employed for heating the stabilizer up to the activating temperature.

Method for activating a gas phase stabilizer installed within a

The invention relates to a method for arranging conveyor-transported fragmentary particles into one row or several adjacent rows of individual particles before their removal from the conveyor. According to the invention, the conveying base is divided into two subsequent sections, namely, a vibrating section and a subsequent stabilizing section. In the vibrating section the conveying base and the particles on top of it are brought into a relative motion while the particles are subjected to transversal counter-forces in order to concentrate the particles along a straight line in the longitudinal direction of the conveying base. In the stabilizing section the relative motion of the conveying base and the particles on top of it is stopped in good time before the removal of the particles from the conveyor, so that the particles no longer move in relation to each other when they are being removed from the conveyor. This substantially facilitates the analysis of the particles and their separation from each other.

Method and apparatus for arranging fragmentary particles into a row

According to the method of the invention, samples undergoing analysis for sorting are irradiated one by one in order to excite X-ray fluorescence. In order to take into account the background radiation, the quality whereof varies according to the frequency of the excited radiation, the radiation peak intensity I.sub.1 is measured, as well as the respective intensity I.sub.2 is measured at the same point of the radiation spectrum but in an essentially wider frequency range than the radiation peak. On the basis of the measured intensities I.sub.1 and I.sub.2 are defined the intensities of the X-ray fluorescence F and the background radiation T, and the ratio of these two is used as the selective criterion when sorting the analyzed samples.

Method for taking the radiation background into account in the

The invention concerns a way to prolong the service life of proportional counters, there being added to the gas mixture consisting of a rare gas and a hydrocarbon, serving as gas filling in the counters, hydrogen gas in the amount of 0.05-5.0% by weight, preferably 0.1-2.0% by weight. In addition, the hydrogen gas may in part at least be deuterium.

Way to prolong the service life of proportional counters

Disclosed is a method and an apparatus for analyzing pieces of ore for the purpose of sorting. Each piece falling by the analyzer is irradiated individually by means of two gamma radiation sources operating at different energy levels so selected that, as to the scattering effect, at one level the Compton effect is predominant and at the other level the Compton effect and the photoelectric effect compete with each other. The former effect is strongly dependent on the ordinal number of the element and, thus, by detecting with at least one detector the scattering intensities produced with the said two sources of radiation and comparing the scattering intensities with each other, the proportion of heavy elements in the ore piece can be determined and the ore piece can be classified on the basis thereof. For example, one energy dispersively operating scintillation detector can be used for detecting the scattered radiation.

Method and apparatus for analyzing ore by means of gamma radiation

The invention provides an apparatus for measuring the concentrations of elements in a material sample by the capture gamma method, said apparatus including a neutron source in the form of an isotope source or a neutron generator, a moderator surrounding the neutron source and being at least partly constituted by heavy water, a semiconductor detector serving as gamma radiation detector and positioned in the immediate vicinity of the material to be analyzed and in the flux of slow neutrons, so much of the moderator being provided before the detector that this is reached only by a very low number of fast neutrons that have a damaging effect upon the detector. The material itself can form part of the moderator and also graphite is preferably used as a moderator around said heavy water. Furthermore, a body of bismuth having the shape of a cone or a double cone is preferably positioned in front of the neutron source so as to absorb gamma radiation and to scatter fast neutrons.

Apparatus for measuring the concentrations of elements in a material by

A method and a device for determining or observing the average particle size or particle size distribution in a flow of material, such as a slurry, wherein the material is allowed to flow at a constant velocity through a radiation beam, the time interval distribution of the radiation quanta passing through the material flow is measured, this distribution describing the particle size distribution and offering a possibility to control any changes in the size distribution, and from the measured time interval distribution is subtracted the known time interval distribution of the quanta of the radiation beam emitted by the source of radiation, this known distribution being a Poisson distribution, and, finally, the particle size or size distribution is determined arithmetically on the basis of the observed change in the time interval distribution. Preferably, the source of radiation is an X-ray tube or a radio isotope source, and the radiation detector may be a scintillation detector, a proportional counter or a semi-conductor detector.

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Espoo, Finland

Heikki J Sipila