Samsung Electronics Co., Ltd.

Heewon Lee

Sangkwon Moon

Chanha Kim

Seungkyung Ro

Hyunkyo Oh

Yunjung Lee

Youngdeok Seo

Kangho Roh

Kwangwoo Lee

Woohyun Kang

Jinwook Lee

In Hwan Doh

Donggi Lee

Seongnam Kwon

Seung-Yeon Lee

NamWook Kang

Suejin Kim

Sanghyun Choi

Jisoo Kim

Kui-Yon Mun

Hyuna Kim

Donghoo Lim

Sangjin Yoo

Seongjun Ahn

Oak-Ha Kim

Hong Rak Son

Donghwan Lee

Junjin Kong

Jin-Young Kim

Jinyoung Kim

Sehwan Park

Changkyu Seol

Pilsang Yoon

Ilhan Park

Jong-Nam Baek

Se Hwan Park

Hee-Woong Kang

Su Chang Jeon

Jinwoo Hong

Yeonji Kim

Hee-Tai Oh

Suk-Eun Kang

Sejeong Jang

Hyojin Ahn

Juwon Lee

Hyun-Seung Jei

Byungchan Park

Heetai Oh

Silwan Chang

Sari Go

Hyery No

Youngjoo Seo

Dongcheul Jang

An operation method for controlling a nonvolatile memory device includes initiating a first instance of a respective reliability operation for a respective memory block included in the nonvolatile memory device. The respective reliability operation includes detecting a degradation level of the respective memory block and setting a respective skip reference value based on the detected degradation level. The operation method also includes determining whether a respective number of consecutively skipped instances of the respective reliability operation is less than the respective skip reference value. The operation method further includes selectively skipping or performing a next instance of the respective reliability operation based on the determination result.

Operation method of storage controller for nonvolatile memory device

A method of operating a non-volatile memory device, which is configured to communicate with a storage controller includes: receiving a first request indicating a read reclaim determination and including environment information from the storage controller, performing a first on-chip read operation for generating first distribution information based on the first request, determining whether a read reclaim is required based on the first distribution information, and providing the storage controller with a determination result having a first bit value in response to determining that the read reclaim is required.

Non-volatile memory device determining read reclaim, method of operating the same, and method of operating storage device including the same

There is provided a storage device, which includes: a memory device that includes a plurality of memory blocks, and stores first meta data including first status data and a first parameter in a first memory block among the plurality of memory blocks; and a memory controller that stores second meta data including second status data and second parameters, determines final meta data among a plurality of pieces of meta data including the first meta data and the second status data by comparing a plurality of pieces of status data with the first status data and the second status data, performs parameter confirmation for storing the final meta data in the meta block, and controls the memory device based on a parameter stored in the meta block.

Storage device and method for storing meta data in a distributed manner

Disclosed is a nonvolatile memory device which include a memory cell array including a plurality of memory cells connected to a plurality of word lines, an address decoder that controls a selected word line among the plurality of word lines based on an address received from an external device including a first temperature sensor, a second temperature sensor that measures a read temperature of first memory cells connected to the selected word line from among the plurality of memory cells, and a temperature compensation circuit that calculates a read level offset based on the read temperature and a program temperature of the first memory cells measured by the first temperature sensor and generates a compensation read voltage based on the read level offset. The address decoder is further configured to provide the compensation read voltage to the selected word line.

Nonvolatile memory device and operation method thereof

Disclosed is an operation method of a controller which is configured to control a nonvolatile memory device. The method includes receiving cell counting data associated with selected memory cells included in the nonvolatile memory device from the nonvolatile memory device, adjusting operation parameters of the nonvolatile memory device based on the cell counting data, performing a valley search operation for the selected memory cells based on the adjusted operation parameters, and performing a read operation for the selected memory cells based on a result of the valley search operation.

Operation method of controller configured to control nonvolatile memory device and operation method of storage device

In a method of writing data in a nonvolatile memory device, a write command, a write address and write data to be programmed are received. Offset information representing a verification level is received. The offset information is provided when the write data corresponds to a distribution deterioration pattern by checking an input/output (I/O) pattern of the write data. When the offset information is received, the write data is programmed based on the offset information such that at least one state among a plurality of states included in a distribution of threshold voltages of memory cells in which the write data is stored is changed.

Method of writing data in nonvolatile memory device, nonvolatile memory device performing the same and method of operating memory system using the same

Provided are a storage system including a host and a storage device, and an operation method of the storage system. The storage device includes a memory controller and a memory device, where an operation method of the memory controller includes receiving from the host a first mode change request for a folder, which is a unit for managing at least one file, and a logical address of the at least one file, and in response to the first mode change request, rewriting to the memory device first data corresponding to the logical address in a second operating mode, and invalidating first data which is existing data already written to correspond to the logical address and the first data in a first operating mode, wherein the first mode change request sets a data operation speed to a high-speed mode for the at least one file included in the folder.

Storage system including host and storage device and operation method thereof

Disclosed is a method of operating a storage controller which communicates with a non-volatile memory device. The method includes outputting a first command including a request for on-chip valley search (OVS) count data of a memory region of the non-volatile memory device to the non-volatile memory device, wherein the OVS count data include a first count value of a first read voltage and a second count value of a second read voltage, receiving the OVS count data from the non-volatile memory device, determining a first error count value for the first read voltage and a second error count value for the second read voltage, based on the OVS count data, and determining a subsequent operation, based on the first and second error count values.

Storage controller determining error count, method of operating the same, and method of operating storage device including the same

A nonvolatile memory device including: a memory cell array, the memory cell array including a plurality of cell strings, at least one of the cell strings including a plurality of memory cells stacked in a direction perpendicular to a surface of a substrate, at least one of the memory cells is a multi-level cell storing at least three bits; and a control logic circuit configured to control a page buffer to read a fast read page of the memory cells with one read voltage and at least two normal read pages of the memory cells with the same number of read voltages.

Nonvolatile memory device including a fast read page and a storage device including the same

An operation method of a storage controller which includes a nonvolatile memory device, the method including: collecting a first parameter indicating a degradation factor of a first memory area of the nonvolatile memory device and a second parameter indicating a degree of degradation occurring at the first memory area, in an initial driving period; selecting a first function model of a plurality of function models based on the first parameter and the second parameter and predicting a first error tendency of the first memory area based on the first function model; determining a first reliability interval based on the first error tendency; and performing a first reliability operation on the first memory area of the nonvolatile memory device based on the first reliability interval.

Operation method of a storage controller configured to control a nonvolatile memory device

A memory device may determine cell count information from a threshold voltage distribution of memory cells and may determine a detection case based on cell count information when correction of an error in read data, received from the memory device performing a read operation, fails. The memory controller may control the memory device to perform a read operation using a development time determined in consideration of an offset voltage of a read voltage corresponding to the detection case. When correction of the error in the read data fails again, the memory controller may control the memory device to perform a read operation using a corrected read voltage generated using a dynamic offset voltage obtained by inputting the cell count information to a machine learning model.

Memory controller, memory device, and storage device

A storage device and an operating method thereof are provided. The storage device includes a non-volatile memory and a memory controller. The non-volatile memory includes memory blocks each including a word lines. The memory controller determines a word line strength of each of the word lines, adjusts a state count of each of the word lines based on the word line strengths, and adjust a program parameter of each of the word lines to decrease a program time variation between the word lines.

Storage device and operating method thereof

A storage device includes a nonvolatile memory device including a memory block and a memory controller. The memory block includes a first memory region connected with a first word line and a second memory region connected with a second word line. The memory controller sets a read block voltage based on a first read voltage of the first memory region. The memory controller determines a second read voltage of the second memory region based on variation information and the read block voltage.

Storage device including nonvolatile memory device and operating method thereof

A storage device includes a nonvolatile memory device including a plurality of memory blocks, each including a plurality of memory cells connected to a plurality of word lines, and a controller configured to perform a first read operation on memory cells connected to a selected word line included in a selected memory block based on a request of an external host device. The controller is further configured to perform a check read operation that checks a reliability of the memory cells of the selected memory block after performing the first read operation. In the check read operation, the controller is further configured to select and perform one of an actual check and a machine learning-based check.

Storage device and operating method of storage device

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Suwon-si, South Korea

Heewon Lee