Samsung Electronics Co., Ltd.

Koh Young Technology Inc.

Samsung Display Co., Ltd.

Kyungpook National University Industry-Academic Cooperation Foundation

Institute for Basic Science

Korea University Industrial Academic Collaboration Foundation

Hee-Tae Kim

Ku-Chul Jung

Se-Young Jang

Kwang-Sub Lee

Hee-Wook You

Sang-Hyuck Yoon

Bong-Ha Hwang

Ja-Geun Kim

So-Jin Ryu

Hyun-Seok Lee

Jae-Sik Yang

Dong-Hoon Lee

In-sang Song

Chang-Oh Jeong

Je-Hun Lee

Do-Hyun Kim

Seung-Jun Lee

Ki-Won Kim

Kyung-Min Kim

Hyun-Jin Kim

Seok-Hyun Nam

Byeoung-ju Ha

Pil-Sang Yun

Sung-woo Hwang

Min-young Kim

Byeong-kwon Ju

Seon-Bae Kim

Jae-Sung Rieh

Jea-shik Shin

Kwang-Ill Kho

Soo-Young Cho

Dong-Chin Lee

Yong-Kyu Kim

Tae-Il Lee

Min-Jeong Wang

Yun-Kwon Park

Min-Ki Lee

Young-Kwon Kim

Yong-Woo Jo

Jong-Wan Choi

Woo-Kang Kim

Yong-Keun Ahn

Won-Jae Cha

A method comprises providing power from a battery to an external device using a first circuit; and receiving power from a first power source to provide power to the battery using a second circuit while providing power to the external device.

Battery charging method and electronic device

In order to inspect a substrate, an image information of a substrate before applying solder is displayed. Then, at least one inspection region on the substrate is image-captured to obtain an image of the inspection region that is image-captured. Then, image information that is to be displayed is renewed and the renewed image information is displayed. And, in order to inspect a foreign substance, obtained image of the inspection region is compared with a reference image of the substrate. Therefore, an operator can easily catch a region corresponding to a specific region of the image that is displayed, and easily detect a foreign substance on the substrate.

Method of inspecting foreign substance on substrate

A system for measuring displacement of an accelerating tube by using a micro-alignment telescope, which includes a vacuum chamber; a hollow accelerating tube in the vacuum chamber; a sighting target attached to a surface of the accelerating tube while protruding from the surface of the accelerating tube; the micro-alignment telescope spaced apart from one side surface of the vacuum chamber; a first lens device interposed between the micro-alignment telescope and the vacuum chamber; and a second lens device spaced apart from an opposite side surface of the vacuum chamber by a distance, wherein the vacuum chamber includes first and second viewports placed on the surfaces of the vacuum chamber in correspondence with each other, and the micro-alignment telescope, the first lens device, the first viewport, the sighting target, the second viewport and the second lens device are aligned on a same axis in one direction.

System for measuring displacement of accelerating tube in high-vacuum chamber by using micro-alignment telescope and method thereof

A method of inspecting a substrate is disclosed. The method is performed by a substrate-inspecting apparatus having at least one projecting module projecting a patterned light onto a substrate fixed on a stage and an inspecting module with a camera capturing an image, and inspecting a plurality of inspection regions of the substrate step by step. The method comprises, setting an inspection order of the inspecting regions according to a lengthwise direction of the substrate, estimating height displacement of a target inspection region by using a tendency information regarding at least one previous inspection region that is already inspected, adjusting height of the inspecting module by using the estimated height displacement of the target inspection region, and inspecting the target inspection region by using the inspecting module of which height is adjusted. Therefore, inspection time is reduced.

Method of inspecting a substrate

A method of inspecting a substrate is disclosed. The method of inspecting a substrate, comprises: obtaining phase data per projecting part with regard to a substrate, by projecting pattern beam onto the substrate having a target object formed thereon through a plurality of projecting parts in sequence; obtaining height data per projecting part with regard to the substrate by using the phase data per the projecting part; compensating tilt of the height data by using the height data per projecting part; modifying the tilt-compensated height data per projecting part; and obtaining integrated height data by using the modified height data.

A light emitting lamp, a backlight assembly and a display device including the same are provided. The light emitting lamp includes a lamp tube longitudinally extended along an extension line, and a plurality of set electrodes disposed on a periphery of the lamp tube and along the extension line. The periphery of the lamp tube is divided into a first region and a second region by a plane including the extension line, and each of the set electrodes includes a first electrode disposed on the first region and a second electrode disposed on the second region.

Light emitting lamp, backlight assembly and display device having the same

A thin film transistor (TFT) substrate and a method of fabricating the same are provided. The thin film transistor substrate may have low resistance characteristics and may have reduced mutual diffusion and contact resistance between an active layer pattern and data wiring. The thin film transistor substrate may include gate wiring formed on an insulating substrate. Oxide active layer patterns may be formed on the gate wiring and may include a first substance. Data wiring may be formed on the oxide active layer patterns to cross the gate wiring and may include a second substance. Barrier layer patterns may be disposed between the oxide active layer patterns and the data wiring and may include a third substance.

Thin film transistor substrate and method of fabricating the same

In order to set an inspection area, a measurement target is disposed onto a stage, a reference data of the measurement target is summoned, and a measurement data of the measurement target is acquired. Then, at least one feature object is selected in the measurement data and the reference data of the measurement target, and at least one feature variable for the selected feature object is extracted from each of the reference data and the measurement data. Thereafter, a change amount of the measurement target is produced by using the feature variable and a quantified conversion formula, and the produced change amount is compensated for to set an inspection area. Thus, the distortion of the measurement target is compensated for to correctly set an inspection area.

Inspection method

A resonant structure is provided, including a first terminal, a second terminal which faces the first terminal, a wire unit which connects the first terminal and the second terminal, a third terminal which is spaced apart at a certain distance from the wire unit and which resonates the wire unit, and a potential barrier unit which is formed on the wire unit and which provides a negative resistance component. Accordingly, transduction efficiency can be enhanced.

Resonant structure comprising wire and resonant tunneling transistor

A fluorescent lamp includes a lamp body, a fluorescent layer and a discharge electrode. The lamp body has a discharge space in which ultraviolet light is generated. The fluorescent layer is formed on an inner surface of the lamp body to change the ultraviolet light into visible light. The discharge electrode is on an end portion of the lamp body to apply a voltage to the discharge space. A ratio of intensities of the visible light at wavelengths of about 545 nm and about 516 nm is about 1.32:1 to about 1.71:1. Therefore, color reproducibility and luminance may be improved.

Fluorescent mixture for fluorescent lamp, fluorescent lamp, backlight assembly having the same and display device having the same

Growing community of inventors

Yongin-si, South Korea

Hee-Tae Kim