Samsung Electronics Co., Ltd.

Hee-Sung Chae

Kyung-Min Kim

Sun-Yool Kang

Yun-Hwan Jung

Jae-Seung Han

Yun-hong Kim

Jin-Woo Kim

Dah-som Kim

Hyeok-jong Lee

Sung-Ho Suh

Seok-Yong Park

An image sensor includes a pixel array including a first pixel and a second pixel which are connected to a first column line, and a row driver configured to control a read operation of the second pixel. A voltage of the first column line is determined based on a higher voltage among a voltage of a floating diffusion node of the first pixel and a voltage of a floating diffusion node of the second pixel during the read operation of the second pixel.

Image sensor and pixel array which generate a pixel signal based on a plurality of pixels, and operation method of the image sensor

An image sensor includes a pixel array including a pixel array comprising a first pixel and a second pixel which are electrically connected to a first column line, a row driver configured to receive a clamp voltage and a selection voltage, select the first pixel based on the clamp voltage and select the second pixel based on the selection voltage. A voltage of the first column line is determined based on a higher voltage among a first output voltage of the first pixel and a second output voltage of the second pixel during a read operation of the second pixel.

Image sensor and pixel array which operate based on a clamp voltage and a selection voltage, and operation method of the image sensor

An image sensor and an operating method of the image sensor are provided. An image sensor includes a pixel array including a plurality of pixels, a ramp signal generator configured to generate a first ramp signal, a buffer including an amplifier of a super source follower structure and outputting a second ramp signal obtained by buffering the first ramp signal, and an analog-to-digital conversion circuit configured to compare a pixel signal output from the pixel array with the second ramp signal and converting the pixel signal to a pixel value.

Image sensor and operating method thereof

An image sensor includes a pixel array, an analog-to-digital converter (ADC), and a test circuit. The pixel array includes a plurality of pixels arranged in rows and columns. Each pixel generates an analog signal based on incident light. The ADC converts the analog signal to a digital signal using a counter. The test circuit receives a test code in a test mode, generates a count clock signal based on the test code, tests a counting operation of the counter according to the count clock signal, and externally outputs a test result of the counter through a test terminal.

Image sensor with test circuit

A signal transfer circuit includes a transmission circuit, a conversion circuit and a sensing output circuit. The transmission circuit outputs a driving signal to a signal line. The conversion circuit receives an input signal that is a single-ended signal transferred through the signal line and converts the input signal to a differential signal including a first output amplified signal and a second output amplified signal. The first output amplified signal swings downwardly from a first output DC level and the second output amplified signal swings upwardly from a second output DC level that is lower than the first output DC level. The sensing output circuit generates an output signal based on the differential signal. The number of the signal lines is reduced without decrease in performance of signal transfer, and sizes of the signal transfer circuit and the device including the signal transfer circuit are reduced.

Signal transfer circuit and image sensor including the same

An image sensor includes a pixel array including a plurality of pixels, an analog-to-digital converter having a first counter for converting an analog signal into a digital signal, and an output buffer having a first memory. A first counter test result value generated as a test result for the first counter is stored in the first memory in a test mode. The output buffer outputs the first counter test result value from the first memory to an outside of the output buffer in response to a first selection signal. The output buffer further includes a reset logic circuit for resetting the first memory depending on whether the first counter test result value is output or not. The plurality of pixels generate the analog signal in response to incident light.

An image sensor includes a pixel array, a plurality of comparators, a plurality of counters and a plurality of synchronization circuits. The pixel array includes a plurality of pixels configured to generate analog signals by sensing incident light. The comparators generate comparison signals by comparing the analog signals with a reference signal. The counters are grouped into a plurality of counter groups. Each of the counters generates digital signals corresponding to the analog signals by counting, the counting terminated by the comparison signals. Each of the synchronization circuits synchronizes input clock signals to a source clock signal to provide synchronized input clock signals to each of the counter groups.

Analog-to-digital converter, including synchronized clocks, image sensor including the same and method of operating image sensor wherein each synchronization circuit to provide synchronized input clock signals for each counter group

A binary-to-Gray converting circuit includes a buffer unit and a conversion unit. The buffer unit generates a data code of n bits in response to a power supply voltage and a second binary bit signal through an nbinary bit signal except for a first binary bit signal corresponding to a least significant bit of a binary code of n bits. The conversion unit generates a Gray code of n bits based on the binary code and the data code, and generates a kGray bit signal of the Gray code by latching a kdata bit signal of the data code in response to a kbinary bit signal of the binary code. A logic level of the kGray bit signal is determined corresponding to a logic level of the kdata bit signal.

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Seoul, South Korea

Hee-Sung Chae