Samsung Electronics Co., Ltd.

Hee-Il Hong

Kang-Young Cho

Provided is a semiconductor device capable of effectively testing whether memory cells and a memory cell array are defective. The semiconductor device may include a memory cell array having a plurality of memory cells and an external test pad connected to an internal test pad. A test voltage may be applied to the plurality of word lines connected to the plurality of memory cells via the external test pad and the internal test pad in a test mode, wherein the test voltage disables the plurality of word lines.

Growing community of inventors

Seongnam-si, South Korea

Hee-Il Hong