Seagate Technology Incorporated

Hee Ching Ho

Ying Su

Kok Tong Soh

Jui Jing Lim

A test apparatus and method are disclosed. The test apparatus disclosed includes an accelerator assembly and holder assembly that releasably holds a test specimen for acceleration along an acceleration path. Following acceleration along the acceleration path, the test specimen is released from the holder assembly and drops to a landing. The landing can be formed of different materials and at different orientations depending upon the test specifications. Following impact with the landing, the shock robustness of the test specimen is determined to generate shock robustness data. In embodiments disclosed, shock data is used to design shock absorber components for the test specimen or product.

Growing community of inventors

Singapore, Singapore

Hee Ching Ho