Crosscheck Technology, Inc.

Hector R Sucar

Tushar R Gheewala

A programmable interface apparatus between a first circuit and either a second operational circuit, or a primary pin, of an IC includes a latch for receiving a test signal. The latch is controlled using probe lines and sense lines from an internal test matrix. In one configuration, such an interface is programmably configured to couple either a primary input signal or a test signal to the operational circuitry. In another configuration, such an interface is programmably configured to couple either an operational circuit signal or a test signal to a primary output pin. In still another configuration, such an interface is programmably configured to couple either an operational circuit signal or a test signal to an operational circuit element. In one embodiment, the interface is formed with a pair of transmission gates, the latch and an invertor. An advantage of such structure is the minimal IC area required. A global control signal is coupled to each transmission gate for configuring the interface for normal operation or test signal operation. For normal operation, an input signal is coupled directly to the interface output. For test signal operation, a test signal is applied to the interface output.

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Fremont, CA, United States of America

Hector R Sucar