The United States of America As Represented by the United States

The United States of America As Represented by the Department of Energy

U.S. Department of Energy

Xradia, Inc.

Hauyee Chang

Xiao-Dong Xiang

Ichiro Takeuchi

Peter G Schultz

Wenbing Yun

Thomas Anthony Case

Michael Feser

Frederick William Duewer

Andrei V Tkachuk

Chen Gao

A process to determine the porosity and/or mineral content of mineral samples with an x-ray CT system is described. Based on the direct-projection techniques that use a spatially-resolved x-ray detector to record the x-ray radiation passing through the sample, 1 micrometer or better resolution is achievable. Furthermore, by using an x-ray objective lens to magnify the x-ray image in a microscope configuration, a higher resolution of up to 50 nanometers or more is achieved with state-of-the-art technology. These x-ray CT techniques directly obtain the 3D structure of the sample with no modifications to the sample being necessary. Furthermore, fluid or gas flow experiments can often be conducted during data acquisition so that one may perform live monitoring of the physical process in 3D.

Process for examining mineral samples with X-ray microscope and projection systems

A dielectric thin film material for high frequency use, including use as a capacitor, and having a low dielectric loss factor is provided, the film comprising a composition of tungsten-doped barium strontium titanate of the general formula (Ba Sr )TiO , where X is between about 0.5 and about 1.0. Also provided is a method for making a dielectric thin film of the general formula (Ba Sr )TiO and doped with W, where X is between about 0.5 and about 1.0, a substrate is provided, TiO , the W dopant, Ba, and optionally Sr are deposited on the substrate, and the substrate containing TiO , the W dopant, Ba, and optionally Sr is heated to form a low loss dielectric thin film.

Tungsten-doped thin film materials

A dielectric thin-film material for microwave applications, including use as a capacitor, the thin-film comprising a composition of barium strontium calcium and titanium of perovskite type (Ba,Sr,Ca,)TiO,. Also provided is a method for making a dielectric thin film of that formula over a wide compositional range through a single deposition process.

Low loss composition of BaxSryCa1-x-yTiO3: Ba0.12-0.25Sr0.35-0.47Ca0.32-0.53TiO3

A dielectric thin-film material for microwave applications, including use as a capacitor, the thin-film comprising a composition of barium strontium calcium and titanium of perovskite type (Ba.sub.x Sr.sub.y Ca.sub.1-x-y)TiO.sub.3. Also provided is a method for making a dielectric thin film of that formula over a wide compositional range through a single deposition process.

Method of forming a dielectric thin film having low loss composition of

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Berkeley, CA, United States of America

Hauyee Chang