Samsung Electronics Co., Ltd.

Hata Mitsuhiro

Sang-Gyun Woo

Hyun-Woo Kim

Jin Kuk Hong

Jung-hwan Hah

Kolake Mayya Subramanya

Provided are a mask pattern including a silicon-containing self-assembled molecular layer, a method of forming the same, and a method of fabricating a semiconductor device. The mask pattern includes a resist pattern formed on a semiconductor substrate and the self-assembled molecular layer formed on the resist pattern. The self-assembled molecular layer has a silica network formed by a sol-gel reaction. To form the mask pattern, first, the resist pattern is formed with openings on an underlayer covering the substrate to expose the underlayer to a first width. Then, the self-assembled molecular layer is selectively formed only on a surface of the resist pattern to expose the underlayer to a second width smaller than the first width. The underlayer is etched by using the resist pattern and the self-assembled molecular layer as an etching mask to obtain a fine pattern.

Growing community of inventors

Suwon-si, South Korea

Hata Mitsuhiro