Shimadzu Corporation

Haruo Shimaoka

Shinichiro Totoki

Kenji Takubo

Yukihisa Wada

Naoji Moriya

Kikuo Okuyama

Yoshio Tsunazawa

Motoaki Adachi

Akihiro Fukai

Michio Higuchi

A particle size distribution measuring apparatus having: a light intensity distribution obtaining unit for obtaining the light intensity distribution that occurs when the sample cell is irradiated with light for measurement from a light source through detection by a detector; and a particle size distribution calculating unit for calculating the particle size distribution of the particles to be measured included in the sample by using the light intensity distribution obtained by the light intensity distribution obtaining unit, the temperature adjusting member for adjusting the temperature of the sample cell is movable between a first location along the light path around the sample cell and a second location that is outside the light path, and the temperature adjusting member is moved to the second location when the sample is irradiated with the light for measurement from the light source.

Particle size distribution measuring apparatus

A distribution of AC electric field regularly arranged in a cell is formed while storing a sample having particles dispersed in a medium in the cell, whereby the particles are dielectrically migrated in the medium to generate a diffraction grating by density distribution of the particles. Diffracted light generated by irradiating the diffraction grating by density distribution with measuring light is detected, and evaluation of dielectrophoretic intensities of the particles and/or the medium is performed from the detection result. According to this method, evaluation of dielectrophoretic characteristics can be performed without adhering a phosphor to particles, and since even a particle small in size can achieve a detection level by collecting a number of such particles to form a diffraction grating, dielectric characteristics of microparticles of several nanometers in diameter can be thus quantitatively measured with high sensitivity.

Method and apparatus for evaluating dielectrophoretic intensity of microparticle

Suspended particulate matter in the atmospheric air is sucked into a container by a pump. The suspended particulate matter in the atmospheric air in the container is electrically charged so as to electrically collect it. The collected suspended particulate matter is irradiated with laser beams under the condition that the collected suspended particulate matter is dispersed at an appropriate concentration. A spatial intensity distribution of diffracted and scattered light obtained by irradiating laser beams to the suspended particulate matter is measured. A particle size distribution of the suspended particulate matter P is found from the result of measurement.

Method and apparatus for measuring suspended particulate matter

In a method of monitoring specific microbe in water, a monitored object water is supplied into a flow cell provided in a particle size analyzer based on the laser diffraction method, and by irradiating a laser beam to the flow cell, a spatial intensity distribution of the diffraction and scattering light by a group of the particles contained in the monitored object water is measured to obtain a particle size distribution of the group of the particles. Accordingly, information relating to a possibility of an existence of the specific microbe with a known diameter in the monitored object water can be obtained.

Method of monitoring microbe in water

A particle size analyzer based on laser diffraction method is formed of an irradiation optical system for irradiating laser beam to particles, a measurement optical system for measuring a space intensity distribution by receiving light diffracted/scattered by the particles of the laser beam from the irradiation optical system, and an operation portion for obtaining a particle size distribution of the particles from the results measured by the measurement optical system. The irradiation optical system has a semiconductor laser in an output beam wavelength of 300 to 500 nm as a light source. Thus, particles having diameters of the order of sub-microns can be measured.

Particle size analyzer based on laser diffraction method

Scattered light obtained by irradiating parallel laser beam to particles to be measured is condensed by a condenser lens in a wide angle area from 0&deg; to over 40&deg;, and an intensity distribution of the light is spatially continuously measured by an optical sensor positioned at a focal point of the condenser lens. Before a particle size distribution is calculated from the measured light intensity distribution, measuring error of the scattered light intensity distribution caused by an aberration by the condenser lens and an attenuation on the optical path is corrected by comparing with data obtained through a ray tracing in advance. Thus, the scattered light in a wider angle area are spatially continuously measured to thereby obtain a light intensity distribution with a high resolution in a submicron area.

Particle size analyzer based on the laser diffraction method

A method and apparatus which measures a particle size distribution of each content of powdery contents. Particle size distributions of a plurality of mixtures are calculated by blending the contents in various proportions, referring to the previously measured particle size distribution of each content, then determining the relationship between particular particle sizes in the plurality of particle size distributions and a mixing proportion. A particle size distribution of a mixture blended with the contents is measured, finding the particular particle size in the previously calculated particle size distributions of the mixture, and an actual mixing proportion of the contents in the mixture is estimated from the found particle size and the relations previously determined.

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Nara, Japan

Haruo Shimaoka