Nikon Corporation

Haruo Oda

Ken Tomioka

Eiji Satake

A slit lamp microscope is of the type having an illumination optical system for illuminating the eye to be examined, an observation optical system for observing the illuminated eye to be examined and a photographing unit. The slit lamp microscope comprises exposure control unit for controlling exposure at the time of photographing, a photographing conditions designation arrangement for designating at the time of photographing at least the designation of a part to the eye to be photographed and conditions regarding system of photographing, and an optimal exposure calculation unit for calculating an optimal exposure in accordance with the designated photographing conditions. The exposure control apparatus controls the exposure in accordance with the value of exposure calculated by the optimal exposure calculation unit when the photographing conditions are designated by the photographing conditions designation means.

Slit lamp microscope

An ophthalmic photographing apparatus comprises an illumination optical system for illuminating an eye to be tested, a viewing optical system having a variable magnification optical system for viewing the illuminated eye to be tested, and a photographing device detachably mounted on the viewing optical system. A position change of a predetermined part due to the change of magnification of the variable magnification optical system is measured to produce a signal representing the displacement. The signal representing the magnification of the variable magnification optical system is used to control an intensity of a flash light.

Growing community of inventors

Yokohama, Japan

Haruo Oda