General Electric Company

Harsha Mysore Hatti

Sandra F Feldman

Hua Wang

James P Barren

Kena Kimi Yokoyama

Craig Alan Cantello

James Louis Cifarelli

Arthur Joseph Osborn

Andrew Joseph Poslinski

Paul Charles Bigby

Grigoriy Aleksandrovich Shmigol

A spatially-resolved spectrometer is used to measure streaking in molded sample plastic parts produced using a molding tool with various mold inserts which produce certain desired topological surface features upon these sample plastic parts. The measurements from one or more of these sample plastic parts are then provided to a computerized device which appropriately filters the data and calculates overall data shape, average peak and valley shift, and a quality number indicative of data slopes. These calculations are then used to determine an optimum set of ingredients and processing conditions to be used for the full-scale plastic part production.

System and method to quantify appearance defects in molded plastic parts

An optical alignment fixture includes a carriage pivotally joined to a frame for supporting an optical element. A worm wheel is joined to the carriage, and a driveshaft is mounted to the frame. A worm at one end of the driveshaft is engaged with the worm wheel for rotating the worm wheel and the carriage upon rotation of the driveshaft.

Optical alignment fixture

A patterned sample is analyzed by traversing a light spot across the sample and analyzing detected color at several sites to spatially resolve the pattern. A pattern analyzer includes a holder for supporting the sample which is illuminated by projecting the light spot onto the sample. A color sensor receives light reflected by the sample at the light spot and analyzes color of the sample at the spot. The spot is traversed across the sample surface to obtain a plurality of color readings across the surface to spatially resolve the pattern.

Pattern analyzer

A sample having a coined line is analyzed by traversing a light spot across the sample, and then analyzing both specular and diffuse light reflected from the sample to spatially resolve the coined line. An analyzer includes a holder for supporting the sample which is illuminated by projecting the light spot onto the sample. Light collectors receive the specular and diffuse light from the sample at the spot. The received light is analyzed to detect changes therein indicative of the coined line.

Coined line analyzer

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Schenectady, NY, United States of America

Harsha Mysore Hatti