Texas Instruments Corporation

Harsh Garg

Jaiganesh Balakrishnan

Jawaharlal Tangudu

Francesco Dantoni

Yeswanth Guntupalli

Raju Kharataram Chaudhari

Wenjing Lu

Robert Clair Keller

Kalyan Gudipati

Bragadeesh S

An integrated circuit comprises an input, a digital step attenuator, an analog-to-digital converter, a first output, a second output, a first bandwidth filter, a first band attack detector, a first band decay detector, a second bandwidth filter, a second band attack detector, a second band decay detector, and an automatic gain control. The ADC is configured to output a digital signal including a first and a second frequency range. The first and second bandwidth filters are configured to extract respective digital signals comprising the first and second frequency ranges. The band attack and decay detectors are configured to detect band peaks or decays thereof such that the DSA and External AMP may be controlled by means of the AGC based on the detected band peaks or decays, and ADC attack and ADC decay.

Dual-band AGC for RF sampling receivers

Growing community of inventors

Delhi, India

Harsh Garg