Infineon Technologies Ag

Harry Siebert

Albrecht Mayer

Jens Barrenscheen

Dietmar König

Klaus Scheibert

Martin Mohr

An electronic controlling device and method is disclosed. One embodiment provides at least one module performing specific functions within one of a plurality of module modes on reception of a corresponding module mode request. A system control unit is provided to operate the at least module in one of a plurality of module modes by distributing a corresponding system mode request. The at least one module is adapted to translate the distributed system mode request to a module mode request which is configurable.

Device and method for electronic controlling

In accordance with one aspect of the invention, a system for generating compact function trace data for leaf functions includes a central processing unit (CPU), configured to output program flow information needed for generating a program flow trace, and a trace unit, coupled to the CPU. The trace unit is configured to receive the program flow information from the CPU for generating compact function trace data. The trace unit further comprises a first output mode and a second output mode and is further configured to select either the first output mode or the second output mode for generating compact function trace data.

Compact function trace based on execution length of leaf functions

An arrangement for processing trace data information is provided, the arrangement including, a chip including one or more memory circuits configured to store trace data information relating to a series of instructions, and a trace data information port configured to provide off-chip access to the trace data information; and a direct memory access controller circuit configured to control the transportation of trace data information from the one or more memory circuits to the trace data information port.

Arrangement for processing trace data information, integrated circuits and a method for processing trace data information

An interface device is adapted to: in a first mode, in reaction to test signals and corresponding to a test standard, output signals corresponding to the test standard via at least one signal line. In a second mode it is adapted to, in reaction to test signals and corresponding to the test standard, output signals that do not correspond to the test standard via the at least one signal line.

Interface device and method

In accordance with an aspect of the application, there is provided a system for testing, including a first chip, a second chip, and first and second connections. The first connection is configured to couple a first pin of the first chip to a first pin of the second chip, and to transmit an initial signal from the first chip to the second chip. The second connection is configured to couple a second pin of the first chip to a second pin of the second chip to return the signal as a returned signal to the first chip. The first chip comprises comparison circuitry configured to compare the returned signal with the initial signal.

System for testing connections between chips

A processor generates a signature value indicating a sequence of executed instructions, and the signature value is compared to signature values calculated for two or more possible sequences of executed instructions to determine which instruction sequence was executed. The signature is generated via a signature generator during program execution, and is provided external to the processor via a signature message.

Program code trace signature

A semiconductor device test system has an interface for use with a semiconductor device test method, and a semiconductor device test method. In a first mode of an interface, in reaction to test signals corresponding to a test standard, for example, a JTAG test standard, and received by the interface from a test device, the interface outputs signals corresponding to the test standard to a semiconductor device to be tested. In a second mode of the interface, in reaction to test signals corresponding to the test standard and received by the interface from a test device, the interface outputs signals that do not correspond to the test standard to a semiconductor device to be tested.

Semiconductor device test system with test interface means

A system and method for integrated circuit emulation. One embodiment provides a system for in-circuit emulation of an integrated circuit device with program-controlled components. The system includes an integrated circuit device with program-controlled components used in a system for normal operation. The integrated circuit device having at least one program-controlled emulation unit emulating at least one of the program-controlled components of the integrated circuit device, and at least one statistics memory for storing statistical data of the program-controlled emulation unit during emulation.

System and method for integrated circuit emulation

A system and method for signal transmission, a signal modulation and a signal demodulation device, and a method for signal transmission are disclosed. One embodiment includes transmitting a first pulse signal via a first line; and transmitting a second pulse signal complementary to the first pulse signal via a second line, wherein the point in time of the transmitting of the second signal relative to the point in time of the transmitting of the first signal is varied as a function of the respective digital data to be transmitted.

System and method for signal transmission

An integrated circuit having a subordinate test interface and method for transmitting digital data is disclosed. The integrated circuit includes at least one test interface that is adapted to write and read data in and from a data memory, the at least one test interface includes, for transmitting and receiving data of different content categories, one signal line each for every content category. The integrated circuit further includes an interface module for receiving and transmitting data, and that the interface module is, via the signal lines, connected with the test interface for transmitting the data of the different content categories.

Integrated circuit having a subordinate test interface

A semiconductor device system and a method for modifying a semiconductor device is disclosed. In one embodiment, a function provided by a circuit positioned on the semiconductor device is replaced, modified, and/or supplemented by a function provided by a circuit positioned on a further semiconductor device.

Semiconductor device system and method for modifying a semiconductor device

A system and method for testing an integrated circuit is disclosed. One embodiment includes at least one central processing unit, at least one volatile memory area, and an interface, wherein the volatile memory area is connected to the interface to be written thereto by the interface. The system includes a test device connected with the integrated circuit which is configured to stop the program execution, write data in the volatile memory by using the interface, and start the program execution.

System and method for testing an integrated circuit

A circuit and a method of examining in a microprocessor a section of a first range of values and a second range of values each comprising a lower boundary value and an upper boundary value is disclosed. The method includes examining whether a value of the first range of values is equal to or greater than the lower boundary value of the second range of values, and examining whether the lower boundary value of the first range of values is smaller than or equal to the upper boundary value of the second range of values.

Circuit and method for comparing program counter values

A program-controlled unit has debug resources for monitoring the operations proceeding within the program-controlled unit. The program-controlled unit described is distinguished by the fact that the debug resources contain a CPU, and/or that a portion of the debug resources is provided for monitoring the operations proceeding within the remainder of the debug resources. Debug resources constructed in this way make it possible for errors occurring in program-controlled units to be localized and eliminated rapidly and simply under all circumstances.

Growing community of inventors

Puchheim, Germany

Harry Siebert