General Electric Company

Haribaskar Govindasamy

Sheri George

Andre Leon Maitre

Mark Francis Mcanally

Alexander Suppes

Pavel Pokutnev

Utkarsh Madhav Kulkarni

Marko Rosenmueller

JeanFrancois Bureau

Ranjith Kundoly Pushpangathan

Jean Francois Bureau

A method of locating content portion(s) of an image includes automatically determining a pixel threshold value; comparing the threshold value to the image to determine background and content sets of the pixels; determining boundaries between the background and content sets; determining the content portions using the determined boundaries; and determining bounding boxes for the content portions. A computed-radiography scanner includes an imager; a transport configured to operatively arrange a plurality of plates with respect to the imager so that a single image of the plates can be captured; and a processor configured to automatically locate the content portion(s) in the single image. A locating method includes automatically determining the pixel threshold value; determining the boundaries between portions delimited by the pixel threshold value; determining the content portions using the boundaries; and determining the bounding boxes.

Method and system for processing scanned images

A measurement system includes a receiver configured to receive a measurement signal indicative of a parameter of a measured object. The measurement system also includes a processor configured to iteratively filter the measurement signal using a threshold value. The processor is also configured to adjust the threshold value for each iteration of filtration and determine a signal-to-noise ratio for each iteration of filtration. The processor is also configured to set a filter threshold value to the threshold value for the iteration based on the signal-to-noise ratio.

Filtration thresholding

Aspects of the invention provide a solution for analyzing an object, such as a part of a turbo machine. A planar surface is generated using a curved reformat function based on a surface of a three-dimensional (3D) image of an object. A peel of the 3D image that is adjacent to the surface is determined. Based on the peel, a second planar surface is generated. These two, and/or other similarly generated planar surfaces can be analyzed to determine characteristics of the original object.

Method system and computer product for non-destructive object analysis

Growing community of inventors

Bengaluru, India

Haribaskar Govindasamy