Inspekto A.m.v. Ltd.

Siemens Aktiengesellschaft

Harel Boren

Yonatan Hyatt

Joel Koenka

Alexander Spivak

Dan Carmon

Michael Gotlieb

Zohar Kantor

A visual inspection data collection and analysis system comprising: a plurality of visual inspection appliances (VTA) configured to inspect and acquire visual inspection data relating to inspected items; and a data collection and analytics server (DCAS) configured to receive information comprising the visual inspection data from the multiple VIAs and to analyze the received information to form a big data analysis. The VIAs are adapted for detecting defects or gating or counting the inspected items without the involvement of the DCAS.

Centralized analytics of multiple visual inspection appliances

An automatic inspection process for detecting visible defects on a manufactured item, the process including a set up mode in which images of same-type defect free items, but not images of same-type defected items, are obtained, and an inspection mode in which images of both same-type defect free items and same-type defected items, are obtained and defects are detected, where images of the same-type defect free items are analyzed and based on the analysis the process switches to the inspection mode.

System and method for set up of production line inspection

An appliance and method for automated visual inspection of at least two items from different categories, on a production line, include automatically switching between an item profile of a first of the at least two items for inspection; and an item profile of a second of the at least two items for inspection, based on detection of the first item in an image of the production line.

System and method for visual production line inspection of different production items

An appliance for concurrent automated visual inspection of at least two items comprising: at least two inspection assemblies each comprising a camera assembly, wherein each one of the at least two items is inspected by one of the at least two Inspection assemblies; a controller in data communication with the at least two inspection assemblies, wherein the controller is a computing device, wherein the appliance is adapted to be automatically configured for inspecting the at least two items using the at least two inspection assemblies.

Multi-camera visual inspection appliance and method of use

The invention provides an automatic inspection process for detecting visible defects on a manufactured item. The process includes a set up mode in which images of same-type defect free items, but not images of same-type defected items, are obtained, and an inspection mode in which images of both same-type defect free items and same-type defected items, are obtained and defects are detected. Images of the same-type defect free items are analyzed and based on the analysis the process switches to the inspection mode.

Growing community of inventors

Giv′at-Shmuel, Israel

Harel Boren