Siemens Aktiengesellschaft

Siemens Production and Logistics System Ag

Harald Stanzl

Hans-Horst Grasmueller

Jochen Prittmann

A method for checking the fitting at automatic onserting units for the onserting of substrates with components, comprising the steps of: taking a picture of the surface of a component to be onserted positioned in a delivery means with a camera; comparing the picture in an image evaluation unit following the camera to a stored pattern of the component to be onserted; given agreement in the comparison, onserting the component onto the substrate; and given disagreement in the comparison, outputting an error message.

Method for checking the presentation of components to an automatic onserting unit

A method and apparatus for mounting a component onto a substrate of an electrical assembly that utilizes a transponder unit. The transponder unit is attached to the substrate for storing mounting process data, such as, the component manufacturer identification code, the number of missing components, and the number of faulty substrate position, before, during or after the mounting process. The stored process data can then be transmitted to a control unit that controls the component mounting apparatus wherein the data is processed and utilized during the mounting operation to enhance process quality control.

Method and apparatus for mounting components onto a substrate of an electrical assembly

A configuration for positioning components within the compartments on a delivery belt prior to their removal by an onserting apparatus. The configuration can include a brush and a vibrator.

Method and apparatus for delivering components on a compartmented belt

A device for detecting the position, coplanarity and separation of terminals of printed circuit board components wherein the terminals are consecutively imaged on a topically resolving detector through the use of an illuminating light source, and wherein the direct reflections are suppressed by the use of a polarized light source and by the existence of an optical analyzer in the imaging beam path, resulting in only the diffused reflections being used for imaging to avoid overradiation of the detector.

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Munich, Germany

Harald Stanzl