Leica Microsystems (schweiz) Ag

Leica Instruments (singapore) Pte. Ltd.

Leica Microsystems Ag

Leica Instruments Pte. Ltd.

Harald Schnitzler

Robert Paulus

Reto Zuest

Klaus-Peter Zimmer

Ruedi Rottermann

Marc Honegger

Reto Züst

Heinz Zimmermann

Manfred Kuster

Christian Marte

Didier Henry

Robert Lettow

Peter Strobel

Guenter Grabher

Rouven Heeb

Georg Schlaffer

James Ng

A microscope () is described, comprising an autofocus system () for executing a focusing procedure, having a first image sensor (), arranged in a first outcoupled beam path (), for acquiring a first image (); and a second image sensor (), arranged in a second outcoupled beam path (), for acquiring a second image (). The autofocus system () is embodied in such a way that the focusing procedure is executable on the basis of at least a first operating mode and a second operating mode.

Microscope

A microscope () is described, having an autofocus system () for executing a focusing procedure, having a first image sensor (), arranged in a first outcoupled beam path (), for acquiring a first image (); and a second image sensor (), arranged in a second outcoupled beam path (), for acquiring a second image (). The autofocus system () is embodied to adjust a relative location of the focal plane () with respect to the object plane (), at a focus displacement speed, during the image acquisition time for acquisition of the first image () acquired by the first image sensor () and of the second image () acquired by the second image sensor (), the focus displacement speed being equal to the ratio of an increment to the image acquisition time, and the increment being larger than the depth of focus of the microscope ().

A microscope () is described, having an autofocus system () for executing a focusing procedure, having a first image sensor (), arranged in a first outcoupled beam path (), for acquiring a first image (); and a second image sensor (), arranged in a second outcoupled beam path (), for acquiring a second image (). The autofocus system () is embodied to ascertain a contrast difference based on contrast values of the first image () acquired by the first image sensor () and of the second image () acquired by the second image sensor (), and to set a relative location of the focal plane () with respect to the object plane () based on the ascertained contrast difference, the first and the second image () each encompassing image information furnished by the first and the second image sensor () each embodied as an area sensor.

The invention relates to a transmitted light illumination apparatus () for a microscope (), said transmitted light illumination apparatus () comprising, a planar light source (), a mirror () having a concave mirror surface () arranged in the direction of light emitted from the planar light source (), and at least one diaphragm element () being at least partially opaque and being arranged between the planar light source () and the concave mirror surface () such that by moving the at least one diaphragm element () in at least one direction parallel to a plane defined by the planar light source (), the planar light source () is at least partially covered by the at least one diaphragm element ().

Transmitted light illumination apparatus for a microscope

A microscope () for generating a combined image () from multiple individual images (tototo) of an object () encompasses at least one illumination device () for illuminating the object () from at least two different illumination directions (); an image acquisition unit () for acquiring multiple individual images (tototo) of the object () illuminated from the at least two different illumination directions (); and an image combination unit () for combining the individual images (tototo) in order to obtain the combined image (). The image combination unit () is embodied to combine the individual images (tototo) so that an information loss connected with an image artifact of one of the individual images (tototo) is compensated for utilizing an image datum of at least one other of the individual images (tototo) in the combined image ().

Microscope and method for generating a combined image from multiple individual images of an object

The invention relates to a microscope () that encompasses an objective system () and a zoom system (). The microscope furthermore has a diaphragm () for limiting the aperture of the beam path. A control unit () is furthermore provided, that control unit () automatically ascertaining, as a function of the current manifestation of at least one parameter of the microscope (), a respective setting of the diaphragm () predetermined for the current manifestation, and setting the diaphragm () accordingly.

Microscope with self-adapting iris diaphragm

The invention relates to a eucentric digital microscope () that encompasses a stationary stand body () and a pivot unit () mounted pivotably on the stand body (), the pivot unit () being mounted rotatably around a rotation axis () extending in a Y direction. The pivot unit () encompasses at least an optical system having an optical axis () extending orthogonally to the rotation axis (), and a focal plane (), the pivot unit () being arranged nondisplaceably at least in an X direction and in a Z direction relative to the rotation axis ().

Eucentric digital microscope having a pivotally mounted pivot unit

A method () is proposed for furnishing a digital resulting image, using a microscope system () that comprises means (R, L,) for furnishing microscopic images at different numerical apertures as well as a digital image capture unit (). The method encompasses: capturing by means of the digital image capture unit (), in the form of digital individual images, at least two microscopic images at different numerical apertures; and comparing respective mutually corresponding image regions of the digital individual images to one another in terms of their image sharpness, the image regions of the digital individual images having the greatest image sharpness being in each case combined to yield the digital resulting image.

Image capture method for a microscope system, and corresponding microscope system

A microscope () for detecting images of an object () located in an object plane () is described, comprising a microscope stand (); a microscope objective (); a light source () integrated into the microscope stand (); and a beam splitter (), integrated into the microscope objective (), for coupling in a coaxial incident illumination.

A microscope () is described, having an aperture limiter (), arranged in the beam path (), for generating at least one optical channel (). The aperture limiter () is embodied to set the aperture of the at least one optical channel (). The aperture limiter () is furthermore embodied in such a way that in a first operating mode a first optical channel, and in a second operating mode at least one second optical channel, is selectively generable. The aperture limiter is also arranged in the pupil plane of the beam path.

Microscope having an aperture limiter

A microscope () includes an objective system () and a zoom system (). The microscope () furthermore has a manually rotatable rotary wheel () for adjusting the magnification of the zoom system (), the rotary wheel () being rotatable within a predetermined maximum rotation range. The rotary wheel () includes a first engagement element (). In addition, at least one second engagement element (to) is movably mounted on a housing () of the microscope (). This second engagement element (to) is movable between a deactivated and an activated position, being in engagement with the first engagement element () in an activated position. The position of the second engagement element (to) is determined by the respective objective () currently received in the beam path.

Microscope with objective-dependent limitation of the rotation angle of the zoom rotary wheel

The invention relates to an incident illumination device for a microscope, for viewing a sample () in the microscope (), having a planar light source () for incident illumination of the sample (), wherein the planar light source () comprises a panel-shaped light guide having a lower boundary surface (), an upper boundary surface, and at least one lateral surface, as well as at least one light-emitting means that is arranged so that it irradiates light, via at least one lateral surface serving as a light entry surface, into the light guide in such a way that said light propagates in the light guide due to total reflection; wherein the total reflection is disrupted in defined fashion by an element abutting at the lower boundary surface of the light guide against a contact surface so that an outcoupling of light occurs at the upper boundary surface of the light guide.

Incident illumination device for a microscope having a planar light source

A microscope includes an image acquisition system, microscope components and a touch screen. The image acquisition system is configured to optically and digitally image an object so as to produce an object image The microscope components are at least one of motorized and electrically controllable. The touch screen is configured to display the object image in a display area thereof and to sense inputs in the display area within the displayed object image so as to change settings of the microscope components.

Microscope having a touch screen

A transillumination device () for a microscope () comprises a flat panel light source (), a diaphragm arrangement () arranged behind the flat panel light source () in the radiating direction (AR) that comprises two diaphragm elements movable relative to one another, at least one of the two diaphragm elements having a cutout, the two diaphragm elements defining, together with the at least one cutout, a diaphragm opening, wherein the dimensions of the diaphragm opening in two mutually perpendicular directions are determined by the position of the diaphragm elements relative to one another.

Transillumination device for a microscope

A flat panel light source () for a transillumination device of a microscope comprises a plate-shaped light guide () having a lower and an upper boundary surface, and at least one lateral surface (to), and having at least one light-emitting means () arranged to radiate light into the light guide () from at least two different directions, via at least one lateral surface serving as a light entrance surface, such that the light propagates in the light guide () as a result of total reflection, the total reflection being disrupted in defined fashion, by an element () abutting against a contact surface at the lower boundary surface of the light guide (), so that an outcoupling of light occurs on the upper boundary surface of the light guide (), the planar area of the contact surface being smaller than the planar area of the lower boundary surface.

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Lüchingen, Switzerland

Harald Schnitzler