Carl Zeiss Microscopy Gmbh

Other

Carl Zeiss Microimaging Gmbh

Cad Zeiss Microscopy Gmbh

Harald Schadwinkel

Renhu Shi

Hubert Wahl

Jörg Schaffer

Matthias Wald

Lars Stoppe

Ingo Fahlbusch

Rolf Wartmann

Matthias Gonschor

Klaus Knupfer

Michael Gögler

Alexander Scheps

Ralph Lange

Klaus-Georg Knupfer

Frank Nolte

Rebecca Elsässer

Klaus Becker

Holger Richter

Robin Zur Nieden

Dieter Schau

Emmanuel G Reynaud

Benedict Diederich

An adapter is useful with a sample holder of a microscope. The adapter has at least one support region for reproducibly orienting the adapter in a mounted state in a sample holder support. The adapter also has a first coupling point for detachable connection to a coupling structure of a sample holder on one side, and a second coupling point for detachable connection to a coupling structure of a sample manipulator on a side of the adapter opposite to the first coupling point. The adapter is useful with the sample holder, a sample chamber, a microscope and a method for arranging a sample in a detection beam path of a microscope.

Adapter for use with a sample holder, and method for arranging a sample in a detection beam path of a microscope

An object transfer function for a sample object is determined on the basis of a reference measurement. Subsequently, an optimization is carried out in order to find an optimized illumination geometry on the basis of the object transfer function and an optical transfer function for an optical unit.

Structured illumination with optimized illumination geometry

The invention relates to a zoom objective lens with continuously adjustable magnification, comprising five lens groups, where the first lens group, the second lens group and the fifth lens group are fixed in relation to an object. The third lens group and the fourth lens group are axially displaceable. The following conditions apply to the lens:

Zoom objective lens

A system for microscopic applications, including a rotating structural element that acts as a beam splitter and has reflecting and transmitting structures, and which is disposed in an intermediate image plane of the beam path conjugated with the object field, and by which the structure is imaged onto an object in the object plane. The fluorescent light reflected by the object, or caused by the illumination, strikes the structural element as well as an image processing module. The beam reflected and transmitted by the structural element is guided through the image processing module. The structural element is set at an angle to the vertical of the beam path. An optical adapter, which tilts the microscopic intermediate image onto the plane of the structural element acting as beam splitter, is disposed at the interface between the microscope and the image processing module.

System for microscopic applications

The focusing operation of a microscope, control rotary knobs which receive the motion of fingers or hand of an operator to change the focus position relative to a sample under observation. Two of the control rotary knobs are on a common shaft and coaxial with one another and rotationally fixed with respect to one another, and are connected to a position encoder. A toggle switch which is connected to the control circuit and can be actuated by touching or moving one or both rotary control knobs. Whereby the drive circuit is configured such that it generates, as a function of the rotation of the two rotary knobs and as a function of the actuation or position of the toggle switch, a rough or fine adjustment of the focus position relative to the sample under observation.

Operating device for the focusing operation of a microscope

A scanning microscope with a light source which emits illumination light for illuminating a specimen, with at least a first detector for detecting the detection light proceeding from the specimen, and with an objective through which the specimen can be illuminated and detected, wherein the objective is arranged in an illumination beam path and in a detection beam path, and with a second detector for non-descanned detection of the detection light proceeding from the specimen, wherein a compact assembly is provided which comprises a housing which is attached to a microscope stand and which has at least one receptacle for a microscope objective for the illumination beam path and/or detection beam path of the scanning microscope, wherein at least the second detector is arranged in the housing and can be acted upon by specimen light.

Laser scanning microscope and assembly for non-descanned detection

Growing community of inventors

Hannover, Germany

Harald Schadwinkel