Intel Corporation

Intel Deutschland Gmbh

Harald Doppke

Markus Hammes

Rainer Dirk Kreienkamp

Junlin Yan

Vadim Issakov

Herbert Stockinger

Konrad Hirsch

A method for determining an image rejection characteristic of a receiver within a transceiver is provided. The transceiver uses a common local oscillator. The method includes generating a test signal having a spectral peak and generating a local oscillator signal comprising a frequency with an offset from a center frequency of the spectral peak. Further, the method includes down-mixing the test signal in the receiver using the local oscillator signal to generate a down-mixed signal. The method further includes calculating a first value of a signal characteristic of the down-mixed signal in a first frequency range corresponding to a desired signal component of the down-mixed signal and calculating a second value of the signal characteristic of the down-mixed signal in a second frequency range corresponding to an undesired signal component of the down-mixed signal. Further, the method includes comparing the first value and the second value to generate the image rejection characteristic.

System and a method for determining an image rejection characteristic of a receiver within a transceiver

An amplifier circuit, comprises a first amplifier stage contributing to a power of an amplified signal and a second amplifier stage contributing to the power of the amplified signal. The first amplifier stage and the second amplifier stage share a transistor.

Amplifier circuit, radio frequency receiver and mobile telecommunications device

An amplifier operates to provide a high output impedance at an output through a push stage having a first transistor of a first transistor type and a pull stage having a second transistor of a second transistor type that is different from the first transistor type. The first transistor and the second transistor are coupled in a common-gate configuration. The first transistor and the second transistor are shorted together via a capacitor coupled to an input and share a common current path as a push-pull current-reusing common-gate low noise amplifier with a broadband input matching.

High linearity push-pull common-gate amplifier

Representative implementations of devices and techniques provide a built-in self-test for a RF communication device. The communication device self-generates a test signal and processes the test signal through the communication device to determine an operational state of the communication device.

Growing community of inventors

Muelheim an der Ruhr, Germany

Harald Doppke