State Grid Tianjin Electric Power Company

Electric Power Science & Research Institute of State Grid Tianjin Electric Power Company

Haoming Wang

Chi Zhang

Wei Fan

Chun He

Qinghua Tang

Longji Li

Lei Yang

Pengxian Song

Shengchen Fang

Yang Yu

Jun Zhang

Ke Xu

Xu Li

Zhengzheng Meng

Xiaohui Zhu

Lin Li

Fengzheng Zhou

Songyuan Li

Nan Wang

Xiaoguang Wang

Minghui Duan

Cheng Sun

Mingzheng Zhu

Chunhui Zhang

Fei Lu

Weibo Li

Xuliang Zhu

The present disclosure provides a defect detection method and apparatus for a cushion layer of a cable, a device, and a storage medium. The method includes: obtaining specification parameters of a corrugated sheath of a to-be-detected cable, calculating a first volume of a cushion layer without deformation and a second volume of a deformed portion of the cushion layer when the cushion layer is deformed under stress, and calculating a stressed-state deformation ratio of the cushion layer based on the first volume and the second volume; obtaining a voltage, a current, an electrode area, an electrode distance, and an initial electrode distance of the cushion layer when the stressed-state deformation ratio is reached, and calculating volume resistivity of the cushion layer; and comparing the volume resistivity with a preset evaluation parameter to obtain a defect detection result of the cushion layer.

Defect detection method and apparatus for cushion layer of cable, device, and storage medium

Defect detection method for a semi-conducting bedding layer of a power cable includes: obtaining a length parameter, a corrugation pitch parameter, radius parameters, and a thickness parameter of a power cable; obtaining a first resistance value between a shield and a corrugated sheath, and calculating a second resistance value of the shield based on the length parameter and the corrugation pitch parameter; calculating a radial resistance value of the semi-conducting bedding layer based on the first resistance value and the second resistance value; determining a contact angle of a critical point of contact between the corrugated sheath and the semi-conducting bedding layer based on the radius parameters and the thickness parameter; calculating volume resistivity of the semi-conducting bedding layer based on the radial resistance value and the contact angle; and comparing the volume resistivity with a preset evaluation parameter to obtain a defect detection result of the semi-conducting bedding layer.

Defect detection method, apparatus, and device for semi-conducting bedding layer of power cable

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Tianjin, China

Haoming Wang